Paper
6 December 2019 Why orthotropic friction is important on graphene and graphene fluoride thin films
Author Affiliations +
Proceedings Volume 11371, International Workshop on Thin Films for Electronics, Electro-Optics, Energy, and Sensors 2019; 1137104 (2019) https://doi.org/10.1117/12.2531767
Event: International Workshop on Thin Films for Electronics, Electro-Optics, Energy and Sensors, 2019, Reykjavik, Iceland
Abstract
We experimentally demonstrate that graphene and graphene fluoride manifest different coefficients of sliding friction at the edges (graphene fluoride from 5.8×10-3 to 4.9×10-1; graphene from 8.2×10-3 to 3.3×10-1) of a sheet sample versus the interior (graphene fluoride from 5.1×10-3 to 1.5×10-1; graphene from 2.5×10-2 to 2.3×10-1) under ambient humidity conditions (~ 40-60%). Atomic force microscopy (AFM) was used to prove the friction coefficients show distinct directional dependence between graphene and graphene fluoride.
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Sergei F. Lyuksyutov, Liudmyla Barabanova, and Jeffrey A. McCausland "Why orthotropic friction is important on graphene and graphene fluoride thin films", Proc. SPIE 11371, International Workshop on Thin Films for Electronics, Electro-Optics, Energy, and Sensors 2019, 1137104 (6 December 2019); https://doi.org/10.1117/12.2531767
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Graphene

Atomic force microscopy

Chemical vapor deposition

Carbon

Thin films

Capillaries

Surface roughness

RELATED CONTENT

The preparation and application of white graphene
Proceedings of SPIE (December 18 2014)
Investigation of a DNA nucleobase as a gate dielectric for...
Proceedings of SPIE (September 23 2014)
Hybridized graphene materials
Proceedings of SPIE (May 08 2018)
Tip-based patterning of HOPG and CVD graphene
Proceedings of SPIE (May 13 2011)
Photo-induced changes in 157-nm optical coatings
Proceedings of SPIE (May 28 2004)

Back to Top