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24 December 2019 Noise analysis based on data comparison of IR thermal camera
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Proceedings Volume 11372, Sixth International Symposium on LAPAN-IPB Satellite; 113721S (2019) https://doi.org/10.1117/12.2541715
Event: Sixth International Symposium on LAPAN-IPB Satellite, 2019, Bogor, Indonesia
Abstract
Sampling in the lab to get XTM640 data is part of the LWIR XTM640 camera calibration parameter. The XTM640 camera uses a 17μm pixel microbolometer sensor, at the time of operational data acquisition resistance changes according to the infrared radiation that affects it. XTM-640 is an extremely compact and versatile thermal camera module with unique image quality and stability for a broad range of OEM applications, it consists of an uncooled microbolometer. Uncooled microbolometer is known for its low cost. The method used in this paper is comparing the camera output sampling, to acquire how much the noise is, hence the result can be used as a future reference for calibration data.
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Elvira Rachim and Adi Farmasiantoro "Noise analysis based on data comparison of IR thermal camera", Proc. SPIE 11372, Sixth International Symposium on LAPAN-IPB Satellite, 113721S (24 December 2019); https://doi.org/10.1117/12.2541715
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