Translator Disclaimer
27 November 1989 Optical Criterion Of The Selection Of Material Pairs For High-Reflectance Soft X-Ray Multilayers
Author Affiliations +
Abstract
We have investigated, in a complex plane, the behavior of the Berning's formula for the complex amplitude reflectance of a multilayer to find a theoretical basis for the selection of a proper material pair needed to produce a high-reflectance soft X-ray multilayer. An optical criterion has been derived for the selection of such a pair. The criterion is that in a complex plane the Fresnel reflection coefficients of two materials with respect to vacuum should lie close to the real axis and should be far apart from each other. Some examples are given to illustrate the usefulness of this criterion in the design of multilayers.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Masaki Yamamoto, Jianlin Cao, and Takeshi Namioka "Optical Criterion Of The Selection Of Material Pairs For High-Reflectance Soft X-Ray Multilayers", Proc. SPIE 1140, X-Ray Instrumentation in Medicine and Biology, Plasma Physics, Astrophysics, and Synchrotron Radiation, (27 November 1989); https://doi.org/10.1117/12.961862
PROCEEDINGS
5 PAGES


SHARE
Advertisement
Advertisement
RELATED CONTENT

Boron-based multilayers for soft x-ray optics
Proceedings of SPIE (January 01 1992)
Multilayer films for figured x-ray optics
Proceedings of SPIE (December 11 1998)
Multilayer Structures For X-Ray Laser Cavities
Proceedings of SPIE (May 06 1985)

Back to Top