27 November 1989 Soft X-Ray Microscopy In Laser-Plasmas
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Abstract
X-ray microscopy is of extreme importance for measurement of plasma behavior in inertially confinement fusion. We have built a Schwarzschild type x-ray microscope for an x-ray wavelength of λ = 70Å. Nickel Carbon (Ni/C) multilayers have been tested for the normal incidence coating. Reported are critical points of the coating and characteristics of the microscope such as overall reflectivity and spatial resolution.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
K. A. Tanaka, M Kado, R. Kodama, M. Ohtani, S. Kitamoto, T. Yamanaka, K. Yamashita, S. Nakai, "Soft X-Ray Microscopy In Laser-Plasmas", Proc. SPIE 1140, X-Ray Instrumentation in Medicine and Biology, Plasma Physics, Astrophysics, and Synchrotron Radiation, (27 November 1989); doi: 10.1117/12.961868; https://doi.org/10.1117/12.961868
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