Refractive Index Profiles Of Ti:LiNbO3 Planar, Stripe And Buried Waveguides

J. Steffen; A. Neyer; E. Voges

doi:10.1117/12.961911

6 December 1989 Refractive Index Profiles Of Ti:LiNbO3 Planar, Stripe And Buried Waveguides

J. Steffen, A. Neyer, E. Voges

Proceedings Volume 1141, 5th European Conf on Integrated Optics: ECIO '89; (1989) https://doi.org/10.1117/12.961911
Event: 1989 International Congress on Optical Science and Engineering, 1989, Paris, France

Abstract

The reflectivity measurement of angular polished surfaces of Ti:LiNbO3 waveguides is utilized to determine directly the refractive index profiles of planar and stripe waveguides with an accuracy of dn/n = 10^-4 and a local resolution of < 0.1 μm in depth and < 1 μm in width.

Citation Download Citation

J. Steffen, A. Neyer, and E. Voges "Refractive Index Profiles Of Ti:LiNbO3 Planar, Stripe And Buried Waveguides", Proc. SPIE 1141, 5th European Conf on Integrated Optics: ECIO '89, (6 December 1989); https://doi.org/10.1117/12.961911

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