6 December 1989 Refractive Index Profiles Of Ti:LiNbO3 Planar, Stripe And Buried Waveguides
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Proceedings Volume 1141, 5th European Conf on Integrated Optics: ECIO '89; (1989) https://doi.org/10.1117/12.961911
Event: 1989 International Congress on Optical Science and Engineering, 1989, Paris, France
Abstract
The reflectivity measurement of angular polished surfaces of Ti:LiNbO3 waveguides is utilized to determine directly the refractive index profiles of planar and stripe waveguides with an accuracy of dn/n = 10-4 and a local resolution of < 0.1 μm in depth and < 1 μm in width.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. Steffen, A. Neyer, E. Voges, "Refractive Index Profiles Of Ti:LiNbO3 Planar, Stripe And Buried Waveguides", Proc. SPIE 1141, 5th European Conf on Integrated Optics: ECIO '89, (6 December 1989); doi: 10.1117/12.961911; https://doi.org/10.1117/12.961911
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