Open Access Paper
12 March 2020 Front Matter: Volume 11438
Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 11438 including the Title Page, Copyright information, Table of Contents, Author and Conference Committee lists.

The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org.

The papers reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

Please use the following format to cite material from these proceedings:

Author(s), “Title of Paper,” in 2019 International Conference on Optical Instruments and Technology: Optoelectronic Imaging/Spectroscopy and Signal Processing Technology, edited by Guohai Situ, Xun Cao, Wolfgang Osten, Proceedings of SPIE Vol. 11438 (SPIE, Bellingham, WA, 2020) Seven-digit Article CID Number.

ISSN: 0277-786X

ISSN: 1996-756X (electronic)

ISBN: 9781510636545

ISBN: 9781510636552 (electronic)

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Paper Numbering: Proceedings of SPIE follow an e-First publication model. A unique citation identifier (CID) number is assigned to each article at the time of publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online and print versions of the publication. SPIE uses a seven-digit CID article numbering system structured as follows:

  • The first five digits correspond to the SPIE volume number.

  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc. The CID Number appears on each page of the manuscript.

Authors

Numbers in the index correspond to the last two digits of the seven-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first five digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc.

Bi, Yanqiang, 08

Cai, Haiwen, 0S

Cai, Zewei, 0X

Cao, Jie, 0C

Cao, Rui, 0A, 0O

Chen, Ke, 03

Chen, Yewei, 03

Cheng, Xuemin, 0A, 0G, 0O

Cui, Bolun, 0N

Di, Shuai, 14

Ding, Yu, 04

Ding, Zhidan, 0S

Dong, Liquan, 02

Du, Chunlin, 0K

Duan, Fajie, 0T

Duan, Ying, 0U

Fang, Lide, 14

Feng, Guojin, 0P

Feng, Lihui, 17

Gan, Fuping, 0N

Gao, Kun, 0Q, 0Z, 11, 12

Gao, Peng, 13

Gao, Shan, 0U

Gao, Tianli, 03

Gao, Yanze, 06

Gao, Ziqi, 0G

Gong, Changmei, 0F

Gong, Zhenfeng, 03

Gou, Xueke, 0U

Guan, Jinge, 0M

Guo, Yanfang, 0E

Guo, Ying, 02

Han, Jun, 0F

Han, Lu, 0Q

Han, Shaokun, 0O

Hao, Qun, 0A, 0C, 0G, 0O

He, Yongqiang, 0J

Hu, Yao, 0A, 0G, 0O

Hua, Zizheng, 0Q

Wang, Huang, 0T

Huang, Yichen, 16

Jia, Guorui, 0N

Jia, Yanqin, 09

Jia, Yaqing, 14

Jiang, Fengqi, 0H

Jiang, Jie, 0J

Jiang, Jing, 0U

Jiang, Yong, 0I

Jiao, Mingxing, 0L

Jiao, Yexiang, 03

Jin, Weiqi, 0B

Kang, Shasha, 16

Kong, Lingqin, 02

Li, Honglian, 14, 16

Li, Jitian, 06

Li, Lu, 0M

Li, Mengzhu, 0E

Li, Qiong, 0K

Li, Xuan, 0L

Li, Xujian, 0E

Li, Ye, 0I

Li, Zhiwei, 05

Li, Zhuo, 06

Liu, Chun, 0I

Liu, Guodong, 04

Liu, Jiying, 0E

Liu, Likun, 10

Liu, Lixin, 13

Liu, Ming, 02

Liu, Shihua, 0V

Liu, Xiaohua, 02

Liu, Xiaoli, 0X

Liu, Xiaozheng, 0Z, 11, 12

Liu, Yun, 0L

Lu, Li, 0V

Luo, Haiyan, 05

Lv, Wenjing, 14

Ma, Chang, 0D

Ma, Yuxuan, 0P

Mao, Yuxuan, 0Z, 11, 12

Peng, Xiang, 0X

Qi, Junli, 0E

Qian, Beixing, 0I

Qian, Chen, 17

Qian, Fang, 0M

Qiu, Anmei, 0U

Qiu, Su, 0B

Ren, Zhong, 04

Rui, Xiaobo, 0D

Shang, Yonghong, 08

Sheng, Wen, 0V

Shi, Hailiang, 05

Shi, Qingfeng, 06

Shi, Yuzhang, 0M

Si, Lu, 0L

Song, Lipei, 0Y

Song, Jian, 06

Song, Xin, 0H

Sun, Peng, 0M

Tang, Mingyuan, OC

Tang, Wusheng, OE

Tao, Dongxing, 08

Tian, Ailing, 0F

Tian, Bingxin, 0F

Wang, Bang, 0L

Wang, Chao, 0U

Wang, Gao, 0M

Wang, Hongbao, 16

Wang, Huang, 0T

Wang, Jing, 08

Wang, Lei, 0I

Wang, Runze, 0I, 0K

Wang, Wei, 0E

Wang, Weihao, 0Y

Wang, Weizheng, 0E

Wang, Xia, 0B

Wang, Yingbo, 0C

Wang, Zichuan, 0Y

Wei, Jinyu, 0L

Wen, Kai, 13

Wen, Ya, 0Y

Wu, Rui, 07

Wu, Rui, 0S

Xie, Hongjie, 16

Xing, Junhong, 0L

Xiong, Wei, 05

Xu, Chengqiang, 0A, 0C

Xu, Ke, 0K

Xu, Xincheng, 0K

Xue, Jiaan, 0B

Yan, Zhenguo, 0H

Yang, Fei, 0S

Yang, Jufeng, 0Y

Yang, Zhijia, 0Z, 11, 12

Yi, Wenjun, 0E

Yin, Zhongke, 08

Yu, Feihong, 15

Yu, Peifeng, 0U

Yu, Qingxu, 03

Yu, Yang, 0M

Yuan, Shizhu, 0A

Zeng, Lvming, 04

Zeng, Zhoumo, 0D

Zhan, Chuxian, 0L

Zhang, Bin, 07

Zhang, Chao, 08

Zhang, Chuncheng, 04

Zhang, Haiqi, 17

Zhang, Linfeng, 0G

Zhang, Shaohui, 0O

Zhang, Ting, 15

Zhang, Tinghua, 0Z, 11, 12

Zhang, Xiaojie, 0X

Zhang, Xiaole, 06

Zhang, Yian, 0R

Zhang, Yutong, 0Q

Zhang, Zezhan, 0U

Zhang, Zhichao, 0L

Zhao, Dong-e, 07

Zhao, Huijie, 0N

Zhao, Jiejun, 0S

Zhao, Xing, 0Y

Zhao, Yuejin, 02

Zheng, Juanjuan, 13

Zhong, Yekui, 0U

Zhou, Lang, 06

Zhou, Weiti, 0T

Zhou, Yan, 0K

Zhou, Yingjie, 0Q

Zhu, Jubo, 0E

Zhu, Mengjun, 0E

Zou, Jinqian, 0V

Symposium Committees

Symposium Chairs

  • Zheng You, CIS (China), Tsinghua University (China)

  • Jim M. Oschmann, Ball Aerospace (United States)

Symposium Committee

  • Tianchu Li, National Institute of Metrology (China)

  • Songlin Zhuang, University of Shanghai for Science and Technology (China)

  • Lîweî Zhou, Beijing Institute of Technology (China)

  • Shenghua Ye, Tianjin University (China)

  • Yimo Zhang, Tianjin University (China)

  • Guangjun Zhang, Southeast University (China)

Technical Program Chair

  • Guofan Jin, Tsinghua University (China)

Technical Program Co-chairs

  • Jinxue Wang, SPIE

  • Tiegen Liu, Tianjin University (China)

Local Organizing Committee Chair

  • Youhua Wu, China Instrument and Control Society (China)

Local Organizing Committee Co-chairs

  • Guoqiang Ni, Beijing Institute of Technology (China)

  • Qun Hao, Beijing Institute of Technology (China)

General Secretary

  • Tong Zhang, China Instrument and Control Society (China)

Administrative Vice General Secretaries

  • Yu-nan Sun, Beijing Institute of Technology (China)

Liquan Dong, Beijing Institute of Technology (China) Vice General Secretaries

  • Yuejin Zhao, Beijing Institute of Technology (China)

  • Cunlin Zhang, Capital Normal University (China)

Local Organizing Committee

  • Hongda Chen, Institute of Semiconductors, CAS (China)

  • Xuping Zhang, Nanjing University (China)

  • Shangzhong Jin, China Jiliang University (China)

  • Libo Yuan, Guilin University of Electronic Technology (China)

  • Yongcai Guo, Chongqing University (China)

  • Tian Lan, Beijing Institute of Technology (China)

  • Cuiling Li, Beijing Institute of Technology (China)

Conference Committee

Conference Chairs

  • Guohai Situ, Shanghai Institute of Optics and Fine Mechanics, CAS (China)

  • Xun Cao, Nanjing University (China)

  • Wolfgang Osten, Universität Stuttgart (Germany)

Conference Program Committee

  • George Barbastathis, Massachusetts Institute of Technology (United States)

  • David Brady, Duke University (United States)

  • Qionghai Dai, Tsinghua University (China)

  • Byoungho Lee, Seoul National University (Korea, Republic of)

  • Cheng Liu, Shanghai Institute of Optics and Fine Mechanics (China)

  • Takanori Nomura, Wakayama University (Japan)

  • John T. Sheridan, University College Dublin (Ireland)

  • Guangming Shi, Xidian University (China)

  • Lei Tian, Boston University (United States)

  • Feng Wu, University of Science and Technology of China (China)

  • Ping Yu, Missouri University (United States)

  • Jingyi Yu, Shanghai Technology University (China)

  • Jianlin Zhao, Northwestern Polytechnic University (China)

Session Chairs

  • 1 Light Field and Complex Media

    Guohai Situ, Shanghai Institute of Optics and Fine Mechanics, CAS (China)

  • 2 Computational Imaging

    Guohai Situ, Shanghai Institute of Optics and Fine Mechanics, CAS (China)

  • 3 Deep Learning

    Peng Gao, Xidian University (China)

  • 4 Spectral Imaging

    Xun Cao, Nanjing University (China)

  • 5 Image Processing

    Kebin Shi, Peking University (China)

Introduction

This volume contains papers presented during the 2019 International Conference on Optical Instrument and Technology (OIT 2019) at the topical meeting of Optoelectronic Imaging/Spectroscopy and Signal Processing Technology. The focus of this meeting was especially directed to advancements in this field and related areas. The extended scope was honored by a great response to our call for papers. Scientists and engineers, in particular from China, offered more than 50 papers.

This enormous response demanded a strong review of the papers to select the best out of the overwhelming number of excellent papers. The strong limitation of the number of papers which could be presented orally and discussed effectively during a one-and-a-half day meeting without holding parallel sessions was again an important factor. The classification of all accepted papers into the five topical sessions listed above was also very difficult and it often required compromises. We hope that our decision will be accepted by the audience.

The editors would like to express their thanks to the international program committee for helping us to find a good solution to finalize the meeting. We would also like to thank all the authors who spent a lot of time and effort in the preparation of their papers. Our appreciation also goes to Prof. Liquan Dong and Mrs. Cuiling Li, and all the local staff from Beijing Institute of Technology (China). Without their help, it would not have been possible to make the meeting so successful.

Guohai Situ

Xun Cao

Wolfgang Osten

Conference Organizers

Opto-Electronic–Mechanic Technology and System Integration Chapter, CIS (China)

Committee on Optoelectronic Technology, COS (China)

Committee on Optics, China Ordnance Society (China)

Optical Instrument Chapter, CIS (China)

Beijing Institute of Technology (China)

Tianjin University (China)

Tsinghua University (China)

Peking University (China)

Nanjing University (China)

Zhejiang University (China)

Nankai University (China)

Capital Normal University (China)

Beijing University of Posts and Telecommunications (China)

Chongqing University (China)

University of Shanghai for Science and Technology (China)

Instrument Society of America (United States)

Institute of Measurement and Control (United Kingdom)

Hong Kong Institution of Engineers (Hong Kong, China)

The Society of Measurement and Control (Japan)

© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 11438", Proc. SPIE 11438, 2019 International Conference on Optical Instruments and Technology: Optoelectronic Imaging/Spectroscopy and Signal Processing Technology, 1143801 (12 March 2020); https://doi.org/10.1117/12.2566203
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KEYWORDS
Lithium

Multichannel imaging systems

Coded aperture imaging

3D image enhancement

3D image processing

3D image reconstruction

Computing systems

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