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12 March 2020 Front Matter: Volume 11439
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This PDF file contains the front matter associated with SPIE Proceedings Volume 11439, including the Title Page, Copyright information, Table of Contents, Author and Conference Committee lists.

The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org.

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Author(s), “Title of Paper,” in 2019 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, edited by Jigui Zhu, Kexin Xu, Hai Xiao, Sen Han, Proceedings of SPIE Vol. 11439 (SPIE, Bellingham, WA, 2020) Seven-digit Article CID Number.

ISSN: 0277-786X

ISSN: 1996-756X (electronic)

ISBN: 9781510636569

ISBN: 9781510636576 (electronic)

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Paper Numbering: Proceedings of SPIE follow an e-First publication model. A unique citation identifier (CID) number is assigned to each article at the time of publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online and print versions of the publication. SPIE uses a seven-digit CID article numbering system structured as follows:

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  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc. The CID Number appears on each page of the manuscript.

Authors

Numbers in the index correspond to the last two digits of the seven-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first five digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc.

Bai, Jinpeng, 0T

Bi, Yanqiang, 0L, 0R

Bu, Zean, 06

Cao, Changqing, 1C

Cao, Danhua, 04

Chang, Xu, 13

Chen, Dong, 1F

Chen, Fan, 0U

Chen, Longhui, 1Q

Chen, Qian, 10, 15, 1M

Chen, Xianlei, 1R

Chen, Yongxia, 14, 1D

Cui, Yaoyao, 1D

Dang, Qian, 1O

Deng, Junwu, 0R

Ding, Dan, 0E

Dong, Bing, 0J

Dong, Hang, 06

Dong, Kaixian, 1H

Dong, Long, 1J

Du, Yinfei, 1D

Duan, Xiaodeng, 0M

Fan, Chao, 0L, 0R

Fan, JingJing, 1N

Fan, Ying, 16

Feng, Guojin, 07

Feng, Qibo, 0A, 12

Feng, Zhejun, 1C

Fu, Beibei, 14, 1D

Fu, Luhua, 09

Fu, Min, 0U

Fu, Xi hong, 1O

Fu, Yangting, 1G, 1P

Gan, Haiyong, 1G, 1P

Gan, Xiaochuan, 0S

Gao, Janmin, 19

Gao, Qinghua, 1L

Gao, Shen, 1D

Gao, Wen, 0L

Gao, Yang, 0Z

Gu, Guohua, 10, 15, 1M

Guo, Sasa, 17

Guo, Tong, 03

Guo, Xiaohu, 0K

Han, Yanna, 0J

Hao, Huadong, 1R

Hao, Junjie, 19

Hao, Qun, 0C, 13

He, Qixin, 0A

He, Weiji, 10, 15, 1M

He, Yingwei, 1G, 1P

Hu, Xinqi, 0J

Hu, Yao, 0C, 13

Hu, Yutong, 08

Huang, Junhui, 19

Ji, Yue, 0D

Jia, Qishen, 1D

Jia, Siyuan, 14

Jia, Xinlin, 0W, 1A, 1F

Jian, Yabin, 1L

Jiang, Junfeng, 1H

Jiang, Xingru, 04

Jing, Xufeng, 1P

Jing, Zekun, 0W, 1A, 1F

Kang, Jiehu, 0M

Kang, Shi-fa, 1O

Kou, Ke, 0Q

Li, Changli, 0U

Li, Cunjun, 1R

Li, Guohong, 1R

Li, Hongru, 0S

Li, Jianhui, 0O, 0Y

Li, Jiliang, 09

Li, Jing, 1C

Li, Mingjia, 1Q

Li, Nana, 0O

Li, Qing, 14

Li, Qiong, 1L

Li, Shuo, 1O

Li, Tengfei, 0K

LI, Ting, 02

Li, Xin, 1E

Li, Xingfei, 0D

Li, Xiyuan, 0L

Li, Yan, 0S

Li, Yanling, 1E

Li, Yanqiu, 0O, 0Y

Li, Yuanyao, 14, 1D

Li, Yue, 05

Li, Zechuan, 1E

Li, Zhaoming, 0E

Li, Zixiong, 0W, 1A, 1F

Lian, Tianhong, 0Q

Liang, Xu, 0V

Liao, Yurong, 0E

Lin, Boying, 0L

Lin, Cunbao, 0E

Lin, Jiarui, 0V, 18, 1I

Liu, Changjie, 0W, 1A, 1F

Liu, Guangtong, 0G

Liu, Guoqing, 0L, 0R

Liu, Jingjing, 11

Liu, Jun, 17

Liu, Ke, 0Y

Liu, Kun, 1H

Liu, Lizhe, 04

Liu, Ruixi, 1J

Liu, Tiantian, 1S, 1T

Liu, Tiegen, 1H

Liu, Wende, 1G, 1P

Liu, Xiangliang, 1G, 1P

Liu, Yang, 0V

Liu, Zeyuan, 1L

Long, Changyu, 0G

Long, Yuan, 05

Lu, Lihua, 13

Lu, Ruijun, 14

Luo, Shuang, 11

Luo, Ying, 07

Ma, Na-na, 1O

Ma, Xiaosu, 0S

Ma, Xinyu, 12

Mao, Yuxin, 0K

Niu, Zhenqi, 0H

Niu, Zhiyuan, 1I

Pan, Xin, 0T

Pan, Yijie, 0I

Qiu, Chao, 15

Qiu, Zhi, 10

Qu, Jiansu, 0S

Qu, Xinghua, 0X

Ran, Yunfeng, 0A

Ren, Rubiao, 0P

Ren, Yongjie, 1I

Ren, Yu, 1K

Rong, Weigang, 10, 15

Ruan, Guowei, 0G

Shang, Yonghong, 1L

Shen, Changyu, 1G, 1P

Shi, Haolei, 1R

Shi, Shendong, 18

Shl, Hailin, 0U

Sun, Anbin, 1N

Sun, Changku, 06, 09, 0F, 0P, 1B

Sun, Xueyin, 0C

Tao, Li, 0G

Tu, YiMeng, 0A

Tuo, Weixiao, 0D

Wang, Bosong, 0I

Wang, Cuo, 0Q

Wang, Guoqing, 0W

Wang, He, 0I

Wang, Jiahan, 08

Wang, Jiazhi, 0O

Wang, Jing, 0L, 0R

Wang, Jinqiang, 1J

Wang, Lifang, 1A

Wang, Peng, 05, 06, 08, 09, 0F, 0P, 1B

Wang, Peng, 1D

Wang, Ping, 02

Wang, Shaopu, 0C

Wang, Shuang, 1H

Wang, Wei, 0G

Wang, Wen, 16

Wang, Xiaoming, 14

Wang, Xiaoyong, 1M

Wang, Xin, 0I

Wang, Ye, 0Y

Wang, Yingying, 1R

Wang, Yunzhi, 1Q

Wang, Zhao, 19

Wang, Zhe, 16

Wang, Zhong, 14

Wang, Ziwen, 0G

Wei, Taoran, 04

Weng, Jun, 0Q

Weng, Qianwen, 03

Wu, Bin, 0M

Wu, Jun, 08

Wu, Jun, 1E

Wu, Tengfei, 0V

Wu, Ze’nan, 1R

Wu, Zhiyang, 1H

Xia, Yifan, 1M

Xiao, Yike, 1G, 1P

Xie, Fang, 1Q

Xu, Haibo, 1Q

Xu, Huizhong, 1R

Xu, Jun, 1E

Xu, Ke, 0R

Xu, Min, 0H

Xu, Nan, 1G, 1P

Xu, Tingting, 08

Xu, Xueyang, 0H

Xue, Li, 1O

Xue, Ting, 0M

Yan, Kejun, 17

Yang, Linghui, 0T, 0V, 18, 1I

Yang, Liuni, 11

Yang, Shundong, 1H

Yang, Suhui, 0I

Yang, Wanglin, 15

Ye, Mingzhe, 0C

Yu, Caizhi, 05

Yu, Xiaoyu, 0U

Yu, Xu-dong, 02

Zeng, Xiaodong, 1C

Zhang, Bin, 0G

Zhang, Bin, 12

Zhang, Bing, 0Z

Zhang, Chengli, 0G

Zhang, Fumin, 0X

Zhang, Hui, 0T

Zhang, Ke, 17

Zhang, Lu, 1S, 1T

Zhang, Tao, 14, 16

Zhang, Tao, 14, 1D

Zhang, Wenwen, 10, 15

Zhang, Xiangchao, 0H

Zhang, Yingjie, 1B

Zhang, Yuhang, 0G

Zhang, Zhen, 0M

Zhang, Zhenyu, 18

Zhang, Zhi-qiang, 02

Zhao, Guanhua, 03

Zhao, Tiekun, 10

Zhao, Weirui, 1S, 1T

Zhao, Xiangyu, 1L

Zhao, Xianyu, 0X

Zhao, Yuejin, 1S, 1T

Zhao, Ziyue, 0N, 1N

Zheng, Caiyun, 04

Zheng, Fajia, 12

Zheng, Hui, 1D

Zheng, Xiang-ke, 1O

Zhong, Wenting, 17

Zhou, Duo, 0P, 1B

Zhou, Guodong, 0O, 0Y

Zhou, Jie, 1H

Zhou, Yu-mei, 02

Zhu, Ge, 0U

Zhu, Jigui, 0V, 18, 1I

Zhu, Rui, 0H

Zou, Zhi, 1N

Zu, Yahui, 0F

Symposium Committees

Symposium Chairs

  • Zheng You, CIS (China), Tsinghua University (China)

  • Jim M. Oschmann, Ball Aerospace (United States)

Symposium Committee

  • Tianchu Li, National Institute of Metrology (China)

  • Songlin Zhuang, University of Shanghai for Science and Technology (China)

  • Liwei Zhou, Beijing Institute of Technology (China)

  • Shenghua Ye, Tianjin University (China)

  • Yimo Zhang, Tianjin University (China)

  • Guangjun Zhang, Southeast University (China)

Technical Program Chair

  • Guofan Jin, Tsinghua University (China)

Technical Program Co-chairs

  • Jinxue Wang, SPIE

  • Tiegen Liu, Tianjin University (China)

Local Organizing Committee Chair

  • Youhua Wu, China Instrument and Control Society (China)

Local Organizing Committee Co-chairs

  • Guoqiang Ni, Beijing Institute of Technology (China)

  • Qun Hao, Beijing Institute of Technology (China)

General Secretary

  • Tong Zhang, China Instrument and Control Society (China)

Administrative Vice General Secretaries

  • Yu-nan Sun, Beijing Institute of Technology (China)

  • Liquan Dong, Beijing Institute of Technology (China)

Vice General Secretaries

  • Yuejin Zhao, Beijing Institute of Technology (China)

  • Cunlin Zhang, Capital Normal University (China)

Local Organizing Committee

  • Hongda Chen, Institute of Semiconductors, CAS (China)

  • Xuping Zhang, Nanjing University (China)

  • Shangzhong Jin, China Jiliang University (China)

  • Libo Yuan, Guilin University of Electronic Technology (China)

  • Yongcai Guo, Chongqing University (China)

  • Tian Lan, Beijing Institute of Technology (China)

  • Cuiling Li, Beijing Institute of Technology (China)

Conference Committee

Conference Chairs

  • Jigui Zhu, Tianjin University (China)

  • Kexin Xu, Tianjin University (China)

  • Hai Xiao, Clemson University (United States)

  • Sen Han, University of Shanghai for Science and Technology (China)

Conference Program Committee

  • Weihong Bi, Yanshan University (China)

  • Fajie Duan, Tianjin University (China)

  • Qibo Feng, Beijing Jiao Tong University (China)

  • Young-Geun Han, Hanyang University (Korea, Republic of)

  • Emily Jianzhong Hao, Institute for Infocomm Research (Singapore)

  • Aaron H. P. Ho, Chinese University of Hong Kong (Hong Kong, China)

  • Yange Liu, Nankai University (China)

  • Yunqi Liu, Shanghai University (China)

  • Xiang Peng, Shenzhen University (China)

  • Changku Sun, Tianjin University (China)

  • Tong Sun, City University, London (United Kingdom)

  • Yiping Wang, University of Southampton (United Kingdom)

  • Liandong Yu, Hefei University of Technology (China)

  • Aping Zhang, Zhejiang University (China)

  • Weiqian Zhao, Beijing Institute of Technology (China)

  • Weihu Zhou, Academy of Optoelectronics, CAS (China)

  • Lianqing Zhu, Beijing Information Science and Technology University (China)

  • Shin Usuki, Shizuoka University (Japan)

  • Yongbo Deng, Karlsruhe Institute of Technology (Germany)

  • Yidong Tan, Tsinghua University (China)

  • Shuming Yang, Xi’an Jiaotong University (China)

  • Zhenzhong Wei, Beihang University (China)

  • Wei Liu, Dalian University of Technology (China)

  • Jian Liu, Harbin Institute of Technology (China)

  • Zonghua Zhang, Hebei University of Technology (China)

  • Guanhao Wu, Tsinghua University (China)

Conference Secretary

  • Jiarui Lin, Tianjin University (China)

Session Chairs

  • 1 Optoelectronic Instruments and Systems

    Qibo Feng, Beijing Jiaotong University (China)

  • 2 Optoelectronic Technology in Metrology

    Yidong Tan, Tsinghua University (China)

  • 3 Optoelectronic Measurement and Detection

    Zonghua Zhang, Hebei University of Technology (China)

  • 4 Optoelectronic Technologies and Applications

    Changku Sun, Tianjin University (China)

Introduction

With the deepening and intensification of information, a wider range of information sources and acquisition methods have become the basis for societal development. Because of its large capacity, high efficiency and high precision, optoelectronic measurement technology has become the main means of information sensing and acquisition. It has and will continue to play an important role in important fields such as consumer electronics, industrial manufacturing, environmental protection, and scientific research.

The optoelectronic measurement research covers a rich variety of content including lots of areas from scientific research, manufacturing industry, to daily life and the scope will continue to be expanded and the content to be more and more in-depth. On one hand, traditional optoelectronic measurement research and application represented by the background of industrial measurement and optoelectronic detection have been constantly improved and concerned performances have been constantly improved as well. On the other hand, the needs of optoelectronic measurement represented by the optical interferometry and optical dynamic measurement have been emerging ceaselessly, as well as the continued development of measuring methods and applications.

More than 60 manuscripts have been accepted (2 invited manuscripts and 21 oral presentations) in the branch of OIT 2019—Optoelectronic Measurement Technology and Systems, ranging many research fields including optoelectronic measurement, optical instruments, industrial metrology, optical interferometry, optical fiber sensing, etc. These manuscripts appropriately reflect the current focusing problems and research level of the optoelectronic measurement field.

Jigui Zhu

Kexin Xu

Hai Xiao

Sen Han

Conference Organizers

  • Opto-Electronic–Mechanic Technology and System Integration Chapter, CIS (China)

  • Committee on Optoelectronic Technology, COS (China)

  • Committee on Optics, China Ordnance Society (China)

  • Optical Instrument Chapter, CIS (China)

  • Beijing Institute of Technology (China)

  • Tianjin University (China)

  • Tsinghua University (China)

  • Peking University (China)

  • Nanjing University (China)

  • Zhejiang University (China)

  • Nankai University (China)

  • Capital Normal University (China)

  • Beijing University of Posts and Telecommunications (China)

  • Chongqing University (China)

  • University of Shanghai for Science and Technology (China)

  • Instrument Society of America (United States)

  • Institute of Measurement and Control (United Kingdom)

  • Hong Kong Institution of Engineers (Hong Kong, China)

  • The Society of Measurement and Control (Japan)

© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 11439", Proc. SPIE 11439, 2019 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 1143901 (12 March 2020); https://doi.org/10.1117/12.2566206
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