1 December 1989 A New Industrial FT-Raman/FTIR Spectrometer
Author Affiliations +
Proceedings Volume 1145, 7th Intl Conf on Fourier Transform Spectroscopy; (1989) https://doi.org/10.1117/12.969423
Event: Seventh International Conference on Fourier and Computerized Infrared Spectroscopy, 1989, Fairfax, VA, United States
At the International conference on Fourier Transform Spectroscopy in 1985, the seed was sown for the development of FT Raman. After establishing a solid base for research applications as shown at the International Conference in 1987. The technique has now advanced to the stage of routine use in industrial product development.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Herve Guy, Herve Guy, Pierre Beauchesne, Pierre Beauchesne, Henry Buijs, Henry Buijs, } "A New Industrial FT-Raman/FTIR Spectrometer", Proc. SPIE 1145, 7th Intl Conf on Fourier Transform Spectroscopy, (1 December 1989); doi: 10.1117/12.969423; https://doi.org/10.1117/12.969423


Vibrations of H8Si8O12, D8Si8O12, and H10Si10O15
Proceedings of SPIE (February 29 1992)
FT-Kaman Spectroscopy And Pulsed Excitation
Proceedings of SPIE (November 30 1989)
FTIR Measurements Of Minor Atmospheric Constituents
Proceedings of SPIE (November 30 1989)
Finite resolution and apodization in FT-Raman spectra
Proceedings of SPIE (February 29 1992)

Back to Top