1 December 1989 A New Industrial FT-Raman/FTIR Spectrometer
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Proceedings Volume 1145, 7th Intl Conf on Fourier Transform Spectroscopy; (1989) https://doi.org/10.1117/12.969423
Event: Seventh International Conference on Fourier and Computerized Infrared Spectroscopy, 1989, Fairfax, VA, United States
Abstract
At the International conference on Fourier Transform Spectroscopy in 1985, the seed was sown for the development of FT Raman. After establishing a solid base for research applications as shown at the International Conference in 1987. The technique has now advanced to the stage of routine use in industrial product development.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Herve Guy, Herve Guy, Pierre Beauchesne, Pierre Beauchesne, Henry Buijs, Henry Buijs, } "A New Industrial FT-Raman/FTIR Spectrometer", Proc. SPIE 1145, 7th Intl Conf on Fourier Transform Spectroscopy, (1 December 1989); doi: 10.1117/12.969423; https://doi.org/10.1117/12.969423
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