1 December 1989 Artifacts In FT-Raman Spectroscopy
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Proceedings Volume 1145, 7th Intl Conf on Fourier Transform Spectroscopy; (1989) https://doi.org/10.1117/12.969411
Event: Seventh International Conference on Fourier and Computerized Infrared Spectroscopy, 1989, Fairfax, VA, United States
Abstract
The rapid improvements in detector technology, interferometer optimization and filter technology have brought the sensitivity in FT-Raman spectroscopy to a point where spectra can be recorded quite readily from most samples. The limitation is no longer due to detector noise. Instead, the problem of spectral artifact lines has now become the primary concern. We have identified several general groups of spectral artifacts, some of which are sample independent.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
D. Bruce Chase, D. Bruce Chase, "Artifacts In FT-Raman Spectroscopy", Proc. SPIE 1145, 7th Intl Conf on Fourier Transform Spectroscopy, (1 December 1989); doi: 10.1117/12.969411; https://doi.org/10.1117/12.969411
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