1 December 1989 Artifacts In FT-Raman Spectroscopy
Author Affiliations +
Proceedings Volume 1145, 7th Intl Conf on Fourier Transform Spectroscopy; (1989) https://doi.org/10.1117/12.969411
Event: Seventh International Conference on Fourier and Computerized Infrared Spectroscopy, 1989, Fairfax, VA, United States
The rapid improvements in detector technology, interferometer optimization and filter technology have brought the sensitivity in FT-Raman spectroscopy to a point where spectra can be recorded quite readily from most samples. The limitation is no longer due to detector noise. Instead, the problem of spectral artifact lines has now become the primary concern. We have identified several general groups of spectral artifacts, some of which are sample independent.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
D. Bruce Chase, D. Bruce Chase, "Artifacts In FT-Raman Spectroscopy", Proc. SPIE 1145, 7th Intl Conf on Fourier Transform Spectroscopy, (1 December 1989); doi: 10.1117/12.969411; https://doi.org/10.1117/12.969411


Raman database considerations for near-infrared systems
Proceedings of SPIE (October 13 2011)
Fourier Transform Raman Spectroscopy In The Near Infrared ...
Proceedings of SPIE (November 30 1989)
Fourier-Transform Raman Spectroscopy Of Biological Assemblies
Proceedings of SPIE (November 30 1989)
Hadamard transform spectroscopy for the 1990s
Proceedings of SPIE (September 30 1990)
Raman: FT or dispersive--is that the question?
Proceedings of SPIE (February 29 1992)
FT-Kaman Spectroscopy And Pulsed Excitation
Proceedings of SPIE (November 30 1989)

Back to Top