1 December 1989 Background Spectra For Rapid- Or Step-Scan FTIR Depth Profiling
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Proceedings Volume 1145, 7th Intl Conf on Fourier Transform Spectroscopy; (1989) https://doi.org/10.1117/12.969501
Event: Seventh International Conference on Fourier and Computerized Infrared Spectroscopy, 1989, Fairfax, VA, United States
Abstract
The evaluation of a polymer of commercial significance to withstand processing and to perform properly has been generally a "trial by fire" process. As industry seeks to improve its product, control costs, and minimize environmental impact and waste, attention to system optimization and control are being pursued. To this end, the need to understand the chemical changes that accompany processing and/or weathering of polymeric systems is making new demands on analytical science. To meet these demands in a timely and direct fashion new techniques for obtaining spectro-chemical information are being investigated. One of these tools is the topic of this report, photoacoustic infrared spectroscopy (PAS-FTIR).
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R O Carter III, R. A. Palmer, R. M. Dittmar, C. J. Manning, S. S. Bains, J. L. Chao, "Background Spectra For Rapid- Or Step-Scan FTIR Depth Profiling", Proc. SPIE 1145, 7th Intl Conf on Fourier Transform Spectroscopy, (1 December 1989); doi: 10.1117/12.969501; https://doi.org/10.1117/12.969501
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