Translator Disclaimer
1 December 1989 Effect Of Diffraction In High Resolution Ftir-Spectrometers
Author Affiliations +
Proceedings Volume 1145, 7th Intl Conf on Fourier Transform Spectroscopy; (1989) https://doi.org/10.1117/12.969624
Event: Seventh International Conference on Fourier and Computerized Infrared Spectroscopy, 1989, Fairfax, VA, United States
Abstract
Utilizing the cube-corner mirrors in FTIR-spectrometers has rendered possible to record the interferogram over very long mirror displacements and extend the best resolving power to 10-3 cm-1. Simultaneously the accuracy of the line positions is better than 10-5 cm-1. These extreme accuracies are needed especially in creating a set of reliable IR-line frequency standards to be used to calibrate other infrared devices. Therefore, it is very important to analyze all the possible sources of errors and find the best ways to eliminate them.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kauko Salonen and Jyrki Kauppinen "Effect Of Diffraction In High Resolution Ftir-Spectrometers", Proc. SPIE 1145, 7th Intl Conf on Fourier Transform Spectroscopy, (1 December 1989); https://doi.org/10.1117/12.969624
PROCEEDINGS
1 PAGES


SHARE
Advertisement
Advertisement
Back to Top