Practical Aspects Of Forward And Reverse Energy Flow Spectroscopy Using The Bomem Da3 FT Spectrometer

H. Buijs; A. Zacharie

doi:10.1117/12.969506

1 December 1989 Practical Aspects Of Forward And Reverse Energy Flow Spectroscopy Using The Bomem Da3 FT Spectrometer

H. Buijs, A. Zacharie

Proceedings Volume 1145, 7th Intl Conf on Fourier Transform Spectroscopy; (1989) https://doi.org/10.1117/12.969506
Event: Seventh International Conference on Fourier and Computerized Infrared Spectroscopy, 1989, Fairfax, VA, United States

Abstract

In modern materials analysis it becomes increasingly important to analyze samples at temperatures different from ambient using a variety of analysis techniques. The analysis techniques can be separated into various classes such as 1) transmission 2) direct absorption via photo conductive measurements or reverse energy flow from a warmer detector to a cooler sample 3) reflection at near normal incidence or grazing angle and 4) emission, with particular emphasis on induced emission such as photo luminescence and Raman scattering. The Bomem DA3 FT spectrometer is particularly convenient for the interfacing of a variety of cryostats and other large accessories to the standard, two sample beam, front sample compartment and the new, greatly enlarged, rear sample compartment, which has two sequential sample focus positions. The DA3 now offers a convenient way to switch between sources of radiation and detector modules at the so called input side of the spectrometer. This avoids the need for moving the sample and its accessory, such as a cryostat, between the output side and the input side (emission port) of the spectrometer: all measurement techniques may be performed with the sample and accessory in one position. Operational details and results of measurements will be presented.

Citation Download Citation

H. Buijs and A. Zacharie "Practical Aspects Of Forward And Reverse Energy Flow Spectroscopy Using The Bomem Da3 FT Spectrometer", Proc. SPIE 1145, 7th Intl Conf on Fourier Transform Spectroscopy, (1 December 1989); https://doi.org/10.1117/12.969506

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available