Topical Protectant Evaluation By FT-IR Spectroscopy

Ernest H. Braue; Michael G. Pannella

doi:10.1117/12.969576

1 December 1989 Topical Protectant Evaluation By FT-IR Spectroscopy

Ernest H. Braue, Michael G. Pannella

Proceedings Volume 1145, 7th Intl Conf on Fourier Transform Spectroscopy; (1989) https://doi.org/10.1117/12.969576
Event: Seventh International Conference on Fourier and Computerized Infrared Spectroscopy, 1989, Fairfax, VA, United States

Abstract

A unique analytical method for evaluating the effectiveness of topical protectants against penetration by chemical agents has been developed using FT-IR and the horizontal attenuated total reflectance (ATR) accessory. A template was fabricated from double-sided adhesive tape attached to a piece of plastic sheet with an 8.0mm hole punched in the middle. This laminate was placed on the surface of the ATR crystal. A uniform thickness layer of topical protectant was applied to the ATR crystal through the hole in the template. Background spectra of the ATR crystal with and without the template were recorded and stored. A chemical challenge was applied to the template filled with topical protectant, and spectra were recorded every 15 seconds using a Nicolet 60SXB FT-IR spectrometer fitted with an MCT-A detector. Analysis of the recorded spectra identified how much time was required for the chemical challenge to break through the topical protectant barrier. The method was validated using polysaturated fat, petroleum jelly, and hexafluoropropylene epoxide polymer as topical protectants. These materials were challenged with ethyl disulfide. The detection threshold concentration for ethyl disulfide in the topical protectant was observed to be 0.5% (w/w). Using a barrier thickness of 0.45mm the break-through times were observed to be 5.0 min and 22.0 min for polysaturated fat and petroleum jelly respectively. The fluoropolymer showed no break-through even after 180 min.

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Ernest H. Braue and Michael G. Pannella "Topical Protectant Evaluation By FT-IR Spectroscopy", Proc. SPIE 1145, 7th Intl Conf on Fourier Transform Spectroscopy, (1 December 1989); https://doi.org/10.1117/12.969576

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KEYWORDS

Attenuated total reflectance

FT-IR spectroscopy

Sensors

Crystals

Fourier transforms

Spectroscopy

Absorbance

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