Research on SNR testing technology of EBCMOS

Guipeng Liu; Yunsheng Qian; Gangcheng Jiao; Hongchang Cheng; Kai Qiao; Yizheng Lang

doi:10.1117/12.2560041

17 April 2020 Research on SNR testing technology of EBCMOS

Guipeng Liu, Yunsheng Qian, Gangcheng Jiao, Hongchang Cheng, Kai Qiao, Yizheng Lang

Proceedings Volume 11455, Sixth Symposium on Novel Optoelectronic Detection Technology and Applications; 1145515 (2020) https://doi.org/10.1117/12.2560041
Event: Sixth Symposium on Novel Photoelectronic Detection Technology and Application, 2019, Beijing, China

Abstract

In the field of low-light night vision, EBCMOS (Electron Bombarded Complementary Metal Oxide Semiconductor) has received much attention due to its high-gain, high-resolution, low-noise, etc. The techniques used to test EBCMOS performance are also in urgent need of development. According to the composition of EBCMOS detectors, based on the existing vacuum device and semiconductor device test methods, the SNR testing method of EBCMOS is proposed and the testing system is designed. The Field Programmable Gate Array(FPGA)-based hardware platform is built in the vacuum environment. The CMOS data is read out by programmable logic design. Finally, the SNR is obtained by the MFC host computer. Experiments show that the system can measure accurate SNR parameters.

Citation Download Citation

Guipeng Liu, Yunsheng Qian, Gangcheng Jiao, Hongchang Cheng, Kai Qiao, and Yizheng Lang "Research on SNR testing technology of EBCMOS", Proc. SPIE 11455, Sixth Symposium on Novel Optoelectronic Detection Technology and Applications, 1145515 (17 April 2020); https://doi.org/10.1117/12.2560041

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