A multi-frequency binary phase unwrapping method

Pengfei Zhang; Yonghua Han; Yuan Chen; Yanjun Fu; Guangyu Jiang

doi:10.1117/12.2563396

17 April 2020 A multi-frequency binary phase unwrapping method

Pengfei Zhang, Yonghua Han, Yuan Chen, Yanjun Fu, Guangyu Jiang

Author Affiliations +

Proceedings Volume 11455, Sixth Symposium on Novel Optoelectronic Detection Technology and Applications; 1145520 (2020) https://doi.org/10.1117/12.2563396
Event: Sixth Symposium on Novel Photoelectronic Detection Technology and Application, 2019, Beijing, China

Abstract

Three-dimensional (3D) measurement of complex surfaces is of great importance in industrial inspection and production. To solve the problem of high accuracy measurement on complex surfaces, a phase unwrapping method based on multi-frequency binary is proposed, which can directly calculate fringe order by using wrapped phase. First, the four-step phase shift fringe patterns whose period changes exponentially are projected onto the measured object (The base is 2, the index is n, n=1, 2, 3...). Then, the four-step phase shift algorithm is used to obtain the wrapped phase of each period. Binary fringe is generated by binarization of the wrapped phase of each period according to the threshold value of 0. The fringe order K is calculated by binary coding and decoding algorithm, and then the wrapped phase in the highest period is unwrapped by K which can obtain the continuous phase of the object. The simulation and experiment verify the validity of the proposed method, and it has high robustness for complex surface and isolated object. The proposed method is simple in calculation, flexible in control and easy to operate. It provides a simple and effective method for improving the accuracy and robustness of the fringe projection profilometry system.

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Pengfei Zhang, Yonghua Han, Yuan Chen, Yanjun Fu, and Guangyu Jiang "A multi-frequency binary phase unwrapping method", Proc. SPIE 11455, Sixth Symposium on Novel Optoelectronic Detection Technology and Applications, 1145520 (17 April 2020); https://doi.org/10.1117/12.2563396

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KEYWORDS

Binary data

3D modeling

Fringe analysis

3D metrology

Phase shifts

CCD cameras

Projection systems

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