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20 August 2020 Precision force measurements with optical tweezers
Declan Armstrong, Alexander Stilgoe, Timo Nieminen, Halina Rubinsztein-Dunlop
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Proceedings Volume 11463, Optical Trapping and Optical Micromanipulation XVII; 114630L (2020) https://doi.org/10.1117/12.2571139
Event: SPIE Nanoscience + Engineering, 2020, Online Only
Abstract
Piconewton scale forces can be measured with optical tweezers by monitoring the deflection of the trapping laser transmitted through a particle. This deflection is caused by a momentum transfer from the beam to the particle, measured as a change in voltage at a correctly placed position sensitive detector. To monitor these forces a conversion constant needs to be determined,which provides a mapping between units of voltage and Newtons. We propose, and experimentally verify, a new technique of detector calibration which outperforms previously developed methods. We also provide a quantitative comparison of different calibration techniques and the circumstances in which they are applicable.
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Declan Armstrong, Alexander Stilgoe, Timo Nieminen, and Halina Rubinsztein-Dunlop "Precision force measurements with optical tweezers", Proc. SPIE 11463, Optical Trapping and Optical Micromanipulation XVII, 114630L (20 August 2020); https://doi.org/10.1117/12.2571139
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KEYWORDS
Optical tweezers
Calibration
Optical testing
Precision measurement
Particles
3D metrology
Optical calibration
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