Probing optical resonances in silicon nanostructures using tunable-excitation Raman spectroscopy

Søren Raza

doi:10.1117/12.2566184

21 August 2020 Probing optical resonances in silicon nanostructures using tunable-excitation Raman spectroscopy

Søren Raza

Proceedings Volume 11467, Nanoengineering: Fabrication, Properties, Optics, Thin Films, and Devices XVII; 114670H (2020) https://doi.org/10.1117/12.2566184
Event: SPIE Nanoscience + Engineering, 2020, Online Only

Abstract

Optical materials with a high refractive index, such as silicon, are receiving increasing attention in the photonics research community. When structured on the nanoscale, these materials display optical Mie-type resonances with low loss and effective manipulation of light. High-refractive-index nanostructures are therefore key ingredients in the design of novel nanophotonic devices and have great technological potential, ranging from surface coloration to ultra-thin optical devices. The performance of such optical devices is directly linked to the electromagnetic near field of high-refractive-index nanostructures. Unfortunately, the optical near field is extremely challenging to measure, and it involves dedicated near-field instruments. Here, we demonstrate that Raman spectroscopy – a technique available in laboratories worldwide – can be turned into a versatile near-field instrument for high-refractive-index nanophotonics Raman spectroscopy measures the inelastic scattering of photons due to phonons and its intensity scales dramatically with the electric near-field intensity. We exploit this property to measure the near-field enhancement produced by two important classes of optical resonances in high-refractive-index nanostructures; Fabry-Pérot and Mie resonances. We realize these resonances in judiciously sized silicon thin films and nanodisk arrays, respectively, and provide experimental characterization using a novel Raman setup with tunable excitation wavelength. An intuitive theoretical model based on the enhancement of the stored electric energy corroborates our experimental findings.

Conference Presentation

Citation Download Citation

Søren Raza "Probing optical resonances in silicon nanostructures using tunable-excitation Raman spectroscopy", Proc. SPIE 11467, Nanoengineering: Fabrication, Properties, Optics, Thin Films, and Devices XVII, 114670H (21 August 2020); https://doi.org/10.1117/12.2566184

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KEYWORDS

Nanostructures

Near field optics

Raman spectroscopy

Near field

Silicon

Nanophotonics

Optical components

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