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20 August 2020 Study of correlation between MTF and extended source encircled energy through Monte-Carlo simulation and measured data
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Abstract
This paper investigates correlation between extended source fraction of encircled energy (FEE) and modulation transfer function (MTF) of an optical system from a metrology point of view. Statistics of FEE for a population of lenses was calculated by using a Monte Carlo simulation incorporating manufacturing tolerances. MTF and extended FEE of a group of lenses were measured. The simulation and measured data demonstrates no correlation between extended FEE and MTF signifying the necessity of separate FEE measurement if essential.
Conference Presentation
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
David P. Biss and Mahmudur Siddiqui "Study of correlation between MTF and extended source encircled energy through Monte-Carlo simulation and measured data", Proc. SPIE 11484, Optical Modeling and Performance Predictions XI, 114840I (20 August 2020); https://doi.org/10.1117/12.2569288
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KEYWORDS
Modulation transfer functions

Monte Carlo methods

Lenses

Tolerancing

Data modeling

Spatial frequencies

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