Study of correlation between MTF and extended source encircled energy through Monte-Carlo simulation and measured data

David P. Biss; Mahmudur Siddiqui

doi:10.1117/12.2569288

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20 August 2020 Study of correlation between MTF and extended source encircled energy through Monte-Carlo simulation and measured data

David P. Biss, Mahmudur Siddiqui

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Proceedings Volume 11484, Optical Modeling and Performance Predictions XI; 114840I (2020) https://doi.org/10.1117/12.2569288
Event: SPIE Optical Engineering + Applications, 2020, Online Only

Abstract

This paper investigates correlation between extended source fraction of encircled energy (FEE) and modulation transfer function (MTF) of an optical system from a metrology point of view. Statistics of FEE for a population of lenses was calculated by using a Monte Carlo simulation incorporating manufacturing tolerances. MTF and extended FEE of a group of lenses were measured. The simulation and measured data demonstrates no correlation between extended FEE and MTF signifying the necessity of separate FEE measurement if essential.

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David P. Biss and Mahmudur Siddiqui "Study of correlation between MTF and extended source encircled energy through Monte-Carlo simulation and measured data", Proc. SPIE 11484, Optical Modeling and Performance Predictions XI, 114840I (20 August 2020); https://doi.org/10.1117/12.2569288

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