You have requested a machine translation of selected content from our databases. This functionality is provided solely for your convenience and is in no way intended to replace human translation. Neither SPIE nor the owners and publishers of the content make, and they explicitly disclaim, any express or implied representations or warranties of any kind, including, without limitation, representations and warranties as to the functionality of the translation feature or the accuracy or completeness of the translations.
Translations are not retained in our system. Your use of this feature and the translations is subject to all use restrictions contained in the Terms and Conditions of Use of the SPIE website.
21 August 2020Cascade optical coherence tomography (C-OCT) towards freeform metrology
Surface form metrology for freeform optical components is a significant challenge that impacts the entire process chain. One of the main aims is that the metrology technique provides sufficiently low measurement uncertainty within a reasonable measurement time. We developed a non-contact, non-part-specific cascade optical coherence tomography (COCT) technique within this metrology context. C-OCT utilizes a primary and a secondary interferometer in a cascade that transforms a difficult-to-measure optical path difference (OPD), which encodes the freeform sag in this case, into a more readily measured OPD in the secondary interferometer. To enable high-speed measurements, we developed the secondary interferometer based on a rotating optical cube. A custom telecentric objective lens and a custom pupil relay enable optical scanning over the sample surface. Experimental results validate the C-OCT technique with consecutive single-point measurements showing precision of ±26 nm (~λ/24 at the He-Ne wavelength) and a preliminary flat surface measurement demonstrating 22 nm RMS (~λ/28) over a central 20 mm diameter region. Developments on the system are underway towards surface measurements on freeform optical components.
The alert did not successfully save. Please try again later.
Di Xu, Andres Garcia Coleto, Zhenkun Wen, Benjamin Moon, Jonathan C. Papa, Michael Pomerantz, John C. Lambropoulos, Jannick P. Rolland, "Cascade optical coherence tomography (C-OCT) towards freeform metrology," Proc. SPIE 11490, Interferometry XX, 114900K (21 August 2020); https://doi.org/10.1117/12.2567080