Single-shot speckle tracking method based on wavelet transform and multi-resolution analysis

Zhi Qiao; Xianbo Shi; Lahsen Assoufid

doi:10.1117/12.2569135

4 September 2020 Single-shot speckle tracking method based on wavelet transform and multi-resolution analysis

Zhi Qiao, Xianbo Shi, Lahsen Assoufid

Proceedings Volume 11492, Advances in Metrology for X-Ray and EUV Optics IX; 114920O (2020) https://doi.org/10.1117/12.2569135
Event: SPIE Optical Engineering + Applications, 2020, Online Only

Abstract

The wavelet-transform-based single-shot X-ray speckle tracking (WXST) method combined with a multi-resolution analysis process was proposed to provide higher noise robustness and faster data processing compared with the correlation-based single-shot X-ray speckle tracking (CXST) technique. The new method was experimentally validated by measuring phase errors of beryllium compound refractive lenses in the transmission geometry. Taking advantages of the wavelet transform and the multi-resolution analysis, the data-analysis efficiency can be improved by two orders of magnitude for samples with phase variation over a large dynamical range. The multiresolution WXST method also shows high reconstruction accuracy and noise robustness. This novel method can broaden the potential applications of speckle-tracking techniques in wavefront sensing, at-wavelength metrology and phase imaging by breaking the bottleneck of the data processing.

Conference Presentation

Citation Download Citation

Zhi Qiao, Xianbo Shi, and Lahsen Assoufid "Single-shot speckle tracking method based on wavelet transform and multi-resolution analysis", Proc. SPIE 11492, Advances in Metrology for X-Ray and EUV Optics IX, 114920O (4 September 2020); https://doi.org/10.1117/12.2569135

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