Peculiarities in the interference pattern obtained by x-ray bilens interferometer

D. A. Zverev; V. G. Kohn; V. A. Yunkin; S. M. Kuznetsov; I. I. Snigireva; A. A. Snigirev

doi:10.1117/12.2568687

21 August 2020 Peculiarities in the interference pattern obtained by x-ray bilens interferometer

D. A. Zverev, V. G. Kohn, V. A. Yunkin, S. M. Kuznetsov, I. I. Snigireva, A. A. Snigirev

Proceedings Volume 11493, Advances in Computational Methods for X-Ray Optics V; 114930L (2020) https://doi.org/10.1117/12.2568687
Event: SPIE Optical Engineering + Applications, 2020, Online Only

Abstract

We present a study of optical properties of the bilens interferometer, where there is a space (Si bulk volume) between two compound refractive lenses (CRL). This design was proposed by analogy with the well-known Billiet bilens for the visible light. It was experimentally shown that under the conditions of partial absorption of X-ray radiation by the bilens, the generated interference pattern has a double period for several central fringes instead of pattern with a constant period. It was shown by computer simulation of such peculiar interference patterns that this phenomena is due to the additional interference between the rays focused by bilens and rays transmitted through the Si material between lenses in bilens. This fact encourages us to propose a new design for bilens and multilens interferometers, in which there is no spacing between CRLs. The proposed design is the lens arrays in the interferometer are arranged in a chessboard pattern, i. e. the arrays are shifted relative to each other by the distance equal to half-length of the single lens.

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D. A. Zverev, V. G. Kohn, V. A. Yunkin, S. M. Kuznetsov, I. I. Snigireva, and A. A. Snigirev "Peculiarities in the interference pattern obtained by x-ray bilens interferometer", Proc. SPIE 11493, Advances in Computational Methods for X-Ray Optics V, 114930L (21 August 2020); https://doi.org/10.1117/12.2568687

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KEYWORDS

Interferometers

X-rays

Lenses

Silicon

Computer simulations

Absorption

Scanning electron microscopy

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