Ultra short nuclear lifetimes measured with fast detectors and faster electronics

Akashrup Banerjee; Marta Polettini; Henning Heggen; Henning Schaffner; Michael Wiebusch; Michael Traxler; Nikolaus Kurz; Jürgen Gerl

doi:10.1117/12.2567973

20 August 2020 Ultra short nuclear lifetimes measured with fast detectors and faster electronics

Akashrup Banerjee, Marta Polettini, Henning Heggen, Henning Schaffner, Michael Wiebusch, Michael Traxler, Nikolaus Kurz, Jürgen Gerl

Author Affiliations +

Proceedings Volume 11494, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XXII; 1149405 (2020) https://doi.org/10.1117/12.2567973
Event: SPIE Optical Engineering + Applications, 2020, Online Only

Abstract

A new approach for measuring lifetimes of nuclear states at the electronic signal processing stage has been tested. Cerium doped lanthanum bromide inorganic scintillator crystals are used as suitable candidates for fast-timing measurements, in the sub-nanosecond region. The pulse processing of fast timing detectors has been performed using fast amplifiers together with FPGA (field-programmable gate array) based signal discrimination and time measurement in a 10 ps (rms- root mean square) TDC (time-to-digital convertor). The performance from the timing perspective has been tested in an accelerated ion-beam experiment.

Conference Presentation

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Akashrup Banerjee, Marta Polettini, Henning Heggen, Henning Schaffner, Michael Wiebusch, Michael Traxler, Nikolaus Kurz, and Jürgen Gerl "Ultra short nuclear lifetimes measured with fast detectors and faster electronics", Proc. SPIE 11494, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XXII, 1149405 (20 August 2020); https://doi.org/10.1117/12.2567973

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