Poster + Paper
20 August 2020 Pulsed-encoded pattern projections for phase-shifting projected fringe profilometry
Author Affiliations +
Conference Poster
Abstract
A pulsed-encoding scheme for phase-shifting projected fringe profilometry is presented. The projected fringe patterns used to perform the phase-shifting technique can be used to identify the fringe orders directly. For the filed of view 300mm×300mm, systematic accuracy was approximately 600μm.
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Wei-Hung Su and Sih-Yue Chen "Pulsed-encoded pattern projections for phase-shifting projected fringe profilometry", Proc. SPIE 11498, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XIV, 114980W (20 August 2020); https://doi.org/10.1117/12.2572295
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KEYWORDS
Phase shifts

Fringe analysis

Inspection

3D metrology

Calibration

Projection systems

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