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18 September 2020 Investigation of excitation dynamics in HfO2 and SiO2 monolayers using subpicosecond pump-and-probe damage testing (Withdrawal Notice)
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This presentation, originally published on 11 September 2020, was withdrawn per author request.
Kafka, Hoffman, Kozlov, and Demos: Investigation of excitation dynamics in HfO2 and SiO2 monolayers using subpicosecond pump-and-probe damage testing (Withdrawal Notice)
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kyle R. P. Kafka, Brittany N. Hoffman, Alexei A. Kozlov, and Stavros G. Demos "Investigation of excitation dynamics in HfO2 and SiO2 monolayers using subpicosecond pump-and-probe damage testing (Withdrawal Notice)", Proc. SPIE 11514, Laser-induced Damage in Optical Materials 2020, 1151411 (18 September 2020); https://doi.org/10.1117/12.2571240
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