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18 September 2020 Study of Electric Field Enhancement Caused by Debris on Laser Optics (Withdrawal Notice)
Hu Huang, Kyle Kafka, Stavros Demos
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Proceedings Volume 11514, Laser-induced Damage in Optical Materials 2020; 115141A (2020) https://doi.org/10.1117/12.2571062
Event: SPIE Laser Damage, 2020, Online Only
Abstract
This presentation, originally published on 11 September 2020, was withdrawn per author request.
Huang, Kafka, and Demos: Study of Electric Field Enhancement Caused by Debris on Laser Optics (Withdrawal Notice)
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
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Hu Huang, Kyle Kafka, and Stavros Demos "Study of Electric Field Enhancement Caused by Debris on Laser Optics (Withdrawal Notice)", Proc. SPIE 11514, Laser-induced Damage in Optical Materials 2020, 115141A (18 September 2020); https://doi.org/10.1117/12.2571062
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KEYWORDS
Laser optics
Laser scattering
Pulsed laser operation
Laser damage threshold
Laser applications
Laser energy
Optical components
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