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11 September 2020 Pulse width dependence of laser-induced damage thresholds on silica glasses by soft X-ray lasers
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Abstract
We evaluated laser-induced damage thresholds (LIDTs) on silica glasses by two kinds of ultra-short soft X-ray laser pulses (13.5 nm, 70 fs, and 13.9 nm, 7 ps). The comparison of our experimental results and the reported values observed by nanosecond soft X-ray pulse revealed a pulse width dependence of LIDTs on silica glasses in the soft X-ray region. The relationship between the pulse width and LIDTs provided valuable discussions of the laser-induced damage mechanism.
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© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Katsuhiro Mikami, Masahiko Ishino, Thanh-Hung Dinh, Shinji Motokoshi, Noboru Hasegawa, Akira Kon, Yuichi Inubushi, Shigeki Owada, Hiroo Kinoshita, and Masaharu Nishikino "Pulse width dependence of laser-induced damage thresholds on silica glasses by soft X-ray lasers", Proc. SPIE 11514, Laser-induced Damage in Optical Materials 2020, 115141E (11 September 2020); https://doi.org/10.1117/12.2570991
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