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15 June 2020 Front Matter: Volume 11523
Proceedings Volume 11523, Optical Technology and Measurement for Industrial Applications 2020; 1152301 (2020)
Event: SPIE Technologies and Applications of Structured Light, 2020, Yokohama, Japan
This PDF file contains the front matter associated with SPIE Proceedings Volume 11523, including the Title Page, Copyright information, and Table of Contents.

The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at

The papers reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

Please use the following format to cite material from these proceedings:

Author(s), “Title of Paper,” in Optical Technology and Measurement for Industrial Applications 2020, edited by Takeshi Hatsuzawa, Rainer Tutsch, Toru Yoshizawa, Proceedings of SPIE Vol. 11523 (SPIE, Bellingham, WA, 2020) Seven-digit Article CID Number.

ISSN: 0277-786X

ISSN: 1996-756X (electronic)

ISBN: 9781510638532

ISBN: 9781510638549 (electronic)

Published by


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  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc. The CID Number appears on each page of the manuscript.


Numbers in the index correspond to the last two digits of the seven-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first five digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc.

Abe, Tetsuya, 04

Bai, Jian, 0F

Cao, Pin, 05

Chang, Chun-Hao, 07

Chen, Hsi-Chao, 07

Chen, Sheng-Bin, 07

Chen, Wei-Lin, 07

Chen, Yuankai, 0F

Chou, Che-Chung, 09

Ehret, Gerd, 0D

Futamura, Ikuo, 08

Garza-Soto, Luis, 03

Gelloz, Bernard, 0H

Golyaev, Yury, 0B

Hagen, Nathan, 02

Han, Xiaokun, 0A

Hayasaki, Yoshio, 08

He, Huayang, 0A

Hu, Haotian, 05

Huang, Pin-Wei, 09

Iizuka, Yuki, 0H

Ishigaki, Hiroyuki, 08

Iwao, Takashi, 0H

Ji, Chenchen, 0E

Jin, Lianhua, 0H

Kobayashi, Shusuke, 0C

Kofanov, Yury, 0B

Kolbas, Yury, 0B

Kondoh, Eiichi, 0H

Kurdybanskaia, Anastasiia, 0B

Kuznetsov, Evgenii, 0B

Kuznetsov, Nikita, 0B

Li, Peihang, 0E

Li, Yao, 0F

Liang, Zijian, 0F

Lin, Tyson, 09

Liu, Shengan, 0F

Lopez-Mago, Dorilian, 03

Lou, Weimin, 05

Lu, Ming-Feng, 0E

Lu, Sheng-Hua, 09

Lu, Yu-Ru, 07

Lu, Zichen, 05

Mamiya, Tkahiro, 08

Sanchez-Soria, Natalia, 03

Schake, Markus, 0D

Soloveva, Tatiana, 0B

Sonoda, Naohiro, 04

Su, Wenying, 0A

Takahashi, Satoru, 0G

Tanaka, Yosuke, 04

Tao, Ran, 0E

Uehara, Makoto, 0H

Wang, Chen, 0F

Wu, Jinmin, 0E

Xue, Yingqi, 0A

Yang, Yongying, 05, 06, 0F

Yoshikawa, Nobukazu, 0C

Yu, Gang, 0E

Zhang, Danhui, 06

Zhang, Pengfei, 06

Zhao, Hongyang, 0F

Conference Committee

Conference Chair

  • Takeshi Hatsuzawa, Tokyo Institute of Technology (Japan)

Conference Co-Chairs

  • Rainer Tutsch, Technische Universität Braunschweig (Germany)

  • Toru Yoshizawa, Tokyo University of Agriculture and Technology (Japan)

Conference Program Committee

  • Masato Aketagawa, Nagaoka University of Technology (Japan)

  • Yasuhiko Arai, Kansai University (Japan)

  • Prathan Buranasiri, King Mongkut’s Institute of Technology Ladkrabang (Thailand)

  • Jürgen W. Czarske, Technische Universität Dresden (Germany)

  • Motoharu Fujigaki, University of Fukui (Japan)

  • Amalia Martínez-García, Centro de Investigaciones en Óptica, A.C. (Mexico)

  • Satoshi Gonda, National Institute of Advanced Industrial Science and Technology (Japan)

  • Sen Han, University of Shanghai for Science and Technology (China)

  • Feng-Lei Hong, Yokohama National University (Japan)

  • Nathan Hagen, Utsunomiya University (Japan)

  • Hideki Ina, Canon Inc. (Japan)

  • Ichiro Ishimaru, Kagawa University (Japan)

  • Lianhua Jin, University of Yamanashi (Japan)

  • Daesuk Kim, Chonbuk National University (Korea, Republic of)

  • Jonathan D. Kofman, University of Waterloo (Canada)

  • Kazuhide Kamiya, Toyama Prefectural University (Japan)

  • Qian Kemao, Nanyang Technological University (Singapore)

  • Fumio Koyama, Tokyo Institute of Technology (Japan)

  • Ryoichi Kuwano, Hiroshima Institute of Technology (Japan)

  • Yu-Lung Lo, National Cheng Kung University (Taiwan)

  • Yasuhiro Mizutani, Osaka University (Japan)

  • Christian Rembe, Technische Universität Clausthal (Germany)

  • Yukitoshi Otani, Utsunomiya University (Japan)

  • Pavel Pavlicek, Palacký University Olomouc (Czech Republic)

  • Takamasa Suzuki, Niigata University (Japan)

  • Satoru Takahashi, The University of Tokyo (Japan)

  • Toshiyuki Takatsuji, National Institute of Advanced Industrial Science and Technology (Japan)

  • Toshitaka Wakayama, Saitama Medical University (Japan)

  • Wei-Chung Wang, National Tsing Hua University (Taiwan)

  • Gao Wei, Tohoku University (Japan)

  • Jiangtao Xi, University of Wollongong (Australia)

  • Hayato Yoshioka, Tokyo Institute of Technology (Japan)

  • Song Zhang, Purdue University (United States)


The first Optical Technology and Measurement for Industrial Applications Conference (OPTM) was held in Minatomirai, Yokohama JAPAN from 23 to 25 April 2019, as a part of the Optics and Photonics International Congress 2019, sponsored by the SPIE and Mechano-optics technical committee in the Japan Society of Precision Engineering. In the conference, 35 oral presentations and 15 posters were presented, which quite a lot for a first time. The topics are full of variety ranging from profilometry, data acquisition, metrology, inspection etc., showing deep interests in this technical field.

The aim of the OPTM 2020 is to provide an international opportunity for introducing up-to-date technology in the field of optical measurement and their applications for industries while at the same time, providing a networking opportunity for young researchers and students; which is another important role of the conference. Also in the venue, other optics related exhibitions and conferences will be held which is a good chance to foster interest in different technical fields. We hope your visit to the port of Yokohama will represent a new step in your technical and research career.

Takeshi Hatsuzawa

Rainer Tutsch

Toru Yoshizawa

© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 11523", Proc. SPIE 11523, Optical Technology and Measurement for Industrial Applications 2020, 1152301 (15 June 2020);

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