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15 June 2020 Simulation design of dark-field imaging scene for optical spherical surface imperfection based on raytracing
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Proceedings Volume 11523, Optical Technology and Measurement for Industrial Applications 2020; 1152306 (2020) https://doi.org/10.1117/12.2574761
Event: SPIE Technologies and Applications of Structured Light, 2020, Yokohama, Japan
Abstract
A method to simulate and design the dark-field imaging scene for optical spherical surface imperfection is proposed based on raytracing. Rays emit from the finite aperture camera model to the world space, split at the optical surface and finally obtain luminance from light sources. Thus the image function can be solved by raytracing and Monte Carlo integration of luminous flux. A typical dark-field imaging scene is presented, of which realistic images of various kinds of lens are rendered. The simulated images can well predict where the spots of light source locate and reveal imperfections. At last, corresponding adjustments are implemented to eliminate the influence of second surface.
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Pengfei Zhang, Yongying Yang D.D.S., and Danhui Zhang "Simulation design of dark-field imaging scene for optical spherical surface imperfection based on raytracing", Proc. SPIE 11523, Optical Technology and Measurement for Industrial Applications 2020, 1152306 (15 June 2020); https://doi.org/10.1117/12.2574761
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