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17 January 1990 Non-Contact Picosecond Electro-Optic Sampling Utilizing Semiconductor Laser Pulses
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Abstract
Non-contact picosecond electro-optic sampling utilizing semiconductor laser pulses, which is compact, easy to use and inexpensive, is described focusing on the recent improvements such as reduction of system noise, adoption of a longitudinal E-0 probe and its advantages, monitoring system of the measurement point, and improvement of the space dependent sensitivity. We demonstrate the equivalent input noise of 125mV/IHz with a temporal resolution of 45ps at a distance of 20gm between the probe tip and the device under test, with a 4.5s measuring time. We also discuss the possibility of absolute voltage measurement.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
S. Aoshima, H. Takahashi, T. Nakamura, and Y. Tsuchiya "Non-Contact Picosecond Electro-Optic Sampling Utilizing Semiconductor Laser Pulses", Proc. SPIE 1155, Ultrahigh Speed and High Speed Photography, Photonics, and Videography '89: Seventh in a Series, (17 January 1990); https://doi.org/10.1117/12.962455
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