8 January 1990 Absolute Reflectance Measurements Of Metallic Surfaces In The 0.8-5.5 µm Region
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Proceedings Volume 1157, Infrared Technology XV; (1990); doi: 10.1117/12.978579
Event: 33rd Annual Technical Symposium, 1989, San Diego, United States
Abstract
An absolute reflectometer for the 0.8 - 5.5 microns region is described, and reflectance spectra for some diffuse metallic surfaces are given. Some of the spectra show a dip of 5-7% in the reflectance values of the surfaces in the 3.0 - 3.5 microns region. Possible causes for the observed dips are discussed.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
D. Sheffer, U. P. Oppenheim, A. D. Devir, "Absolute Reflectance Measurements Of Metallic Surfaces In The 0.8-5.5 µm Region", Proc. SPIE 1157, Infrared Technology XV, (8 January 1990); doi: 10.1117/12.978579; https://doi.org/10.1117/12.978579
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KEYWORDS
Reflectivity

Gold

Infrared technology

Optical spheres

Integrating spheres

Molecules

Diffuse reflectance spectroscopy

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