8 January 1990 Fast-Scan Spectroradiometry
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Abstract
In the field of infrared spectroradiometry there are several systems available, of which a large majority is intended for measurements on relatively stable radiation sources. Such type of equipment is perfectly suitable for the task of determining spectral radiometric characteristics (emissivity; transmission and reflection coefficients) of specific material samples in a laboratory. Their utility, however, becomes limited when used to analyze rapid events especially out in the field, due to the equipments' (low) speed of acquisition and mechanical overall design.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gilbert Gaussorgues, Gilbert Gaussorgues, Thierry Campos, Thierry Campos, Dag Holmsten, Dag Holmsten, } "Fast-Scan Spectroradiometry", Proc. SPIE 1157, Infrared Technology XV, (8 January 1990); doi: 10.1117/12.978617; https://doi.org/10.1117/12.978617
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