Wide Band Imaging Spectrometer

Howard C. Borough; Michael Wilke

doi:10.1117/12.978619

8 January 1990 Wide Band Imaging Spectrometer

Howard C. Borough, Michael Wilke

Proceedings Volume 1157, Infrared Technology XV; (1990) https://doi.org/10.1117/12.978619
Event: 33rd Annual Technical Symposium, 1989, San Diego, United States

Abstract

An imaging spectrometer and associated data processor has been developed which, when fully implemented, will provide a wide (0.4 to 11 micrometer) spectral region coverage with very narrow (hyperspectral) image acquisition capability. The instrument has a field of view of just less than one degree and a pixel IFOV of 27 microradians in the visible - near infrared. The spectral sample dimension is 0.002 micrometers in the visible - near infrared. The instrument is described and the first field test of the short wavelength (0.4 to 2 micrometer) breadboard on the Navy Long Jump III measurement program is reviewed.

Citation Download Citation

Howard C. Borough and Michael Wilke "Wide Band Imaging Spectrometer", Proc. SPIE 1157, Infrared Technology XV, (8 January 1990); https://doi.org/10.1117/12.978619

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