28 July 1989 Current State Of The Art In Filter And Thin Film Performance For Extreme Ultraviolet And X-Ray Research
Author Affiliations +
Abstract
Much work has been done to characterize materials which can be used for filters in the vacuum ultraviolet and X-ray region of the electromagnetic spectrum from about 1500A down to 10Å more or less. This paper compiles and compares the results of different measurement programs, including very recent work which better quantifies transmission as a function of wavelength for various filter and window materials. Of particular interest is some correlated data on Lexan with empirically derived linear absorption coefficients as a function of wavelength and some recent data on the effect of aging on aluminum filters. Also included are some test data and comments on recent efforts to use composite materials to design or adjust the bandpass of a filter to meet particular research requirements. In addition, there are some comments on the development of thin film materials for other uses such as in photocathodes and laser targets. As a result of the combined work reported here, data is made available which will make it easier to specify and predict the performance of filters and windows for specific applications.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Forbes Powell, "Current State Of The Art In Filter And Thin Film Performance For Extreme Ultraviolet And X-Ray Research", Proc. SPIE 1160, X-Ray/EUV Optics for Astronomy and Microscopy, (28 July 1989); doi: 10.1117/12.962625; https://doi.org/10.1117/12.962625
PROCEEDINGS
12 PAGES


SHARE
Back to Top