28 July 1989 Development Of A Normal Incidence Multilayer, Imaging X-Ray Microscope
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Abstract
Normal incidence multilayer x-ray mirror technology has now advanced to the point that high resolution x-ray microscopes with relatively large fields of view are feasible. High resolution aplanatic imaging x-ray microscopes configured from low x-ray scatter normal incidence multilayer optics should be ideal for laser fusion research, biological investigations, and for astronomical studies when used in conjunction with grazing incidence or multilayer x-ray telescope systems. We have designed several Schwarzschild x-ray microscope optics. Diffraction analysis indicates better than 400 A spatial res-olution in the object plane up to a 1 mm field of view can be achieved with 125 A radiation . We are currently fabricating a 20x normal incidence multilayer x-ray microscope of 1.35 meter overall length. We have also analyzed and designed other microscope systems for use in conjunction with x-ray telescopes. We report on the results of these studies and the x-ray microscope fabrication effort.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
David L. Shealy, Richard B. Hoover, Arthur B.C. Walker, and Troy W. Barbee "Development Of A Normal Incidence Multilayer, Imaging X-Ray Microscope", Proc. SPIE 1160, X-Ray/EUV Optics for Astronomy and Microscopy, (28 July 1989); doi: 10.1117/12.962633; https://doi.org/10.1117/12.962633
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