Paper
28 July 1989 W/C Mirror Deposition Optimization
A. F. Jankowski
Author Affiliations +
Abstract
The reflectivity of grazing incidence W/C multilayer mirrors can be optimized by progressively refining structural features through sputter deposition parameter optimization. Beyond the configuration of system geometry, the deposition rate, substrate temperature and working gas pressure significantly affect the multilayer structure morphology. Of these parameters, working gas pressure has an overwhelming effect. The energy and distribution of sputtered adatoms, directly influenced by the sputtering gas pressure, affects the reactivity at and the reconstruction of vapor deposited surfaces. The interface abruptness is therefore affected by working gas pressure. The reduction in interfacial atomic intermixing (hence roughness) generally follows with decreased gas pressure. Correspondingly, the improved reflective efficiency becomes increasingly noticeable from hard to soft x-rays. Structural and reflectivity improvements in the W/C multilayer mirror system, characterized qualitatively using cross-section electron microscopy and quantitatively using x-ray diffraction, will be correlated to an optimization of the sputter deposition parameter - working gas pressure.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. F. Jankowski "W/C Mirror Deposition Optimization", Proc. SPIE 1160, X-Ray/EUV Optics for Astronomy and Microscopy, (28 July 1989); https://doi.org/10.1117/12.962654
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CITATIONS
Cited by 3 scholarly publications.
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KEYWORDS
Reflectivity

Sputter deposition

Argon

Transmission electron microscopy

Mirrors

X-rays

Interfaces

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