Numerical Simulation Of Images Of Perfectly Conducting Rough Surfaces In Scanning Microscopy

J. Felix Aguilar; Eugenio R. MENDEZ

doi:10.1117/12.962711

22 December 1989 Numerical Simulation Of Images Of Perfectly Conducting Rough Surfaces In Scanning Microscopy

J. Felix Aguilar, Eugenio R. MENDEZ

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Proceedings Volume 1161, New Methods in Microscopy and Low Light Imaging; (1989) https://doi.org/10.1117/12.962711
Event: 33rd Annual Technical Symposium, 1989, San Diego, United States

Abstract

The problem of microscopic image formation with optically thick, highly reflecting objects is examined. The optical system considered is a focussed beam scanning microscope with an S-polarized source. The surfaces studied, assumed perfectly conducting, consist of steps, ridges and grooves. Our approach is only two-dimensional but otherwise quite rigorous. The boundary conditions for the electromagnetic field on the surface are determined by solving numerically an integral equation and the resulting images are compared with those found using the Kirchhoff approximation.

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J. Felix Aguilar and Eugenio R. MENDEZ "Numerical Simulation Of Images Of Perfectly Conducting Rough Surfaces In Scanning Microscopy", Proc. SPIE 1161, New Methods in Microscopy and Low Light Imaging, (22 December 1989); doi: 10.1117/12.962711; https://doi.org/10.1117/12.962711

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