Poster + Presentation + Paper
5 March 2021 Imaging dental fluorosis at SWIR wavelengths from 1300 to 2000-nm
Filipp Kashirtsev, Jacob C. Simon, Daniel Fried
Author Affiliations +
Conference Poster
Abstract
Dental fluorosis is an increasing problem in the U.S. due to excessive exposure to fluoride from the environment. Fluorosis causes hypomineralization of the enamel during tooth development and mild fluorosis is visible as faint white lines on the tooth surface while the most severe fluorosis can result in pitted surfaces. It is difficult to quantify the severity of fluorosis and assessments are limited to subjective visual assessments. Dental fluorosis appears with very high contrast at short wavelength infrared (SWIR) wavelengths beyond 1400-nm and we hypothesize that these wavelengths may be better suited for detecting mild fluorosis and for estimating the severity. In this study the contrast of fluorosis of varying severity on extracted human permanent teeth was measured at SWIR wavelengths ranging from 1300-2000-nm using an extended range InGaAs camera and broadband light sources. Cross polarization optical coherence tomography was used to measure the depth of hypomineralization.
Conference Presentation
© (2021) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Filipp Kashirtsev, Jacob C. Simon, and Daniel Fried "Imaging dental fluorosis at SWIR wavelengths from 1300 to 2000-nm", Proc. SPIE 11627, Photonic Therapeutics and Diagnostics in Dentistry, Head and Neck Surgery, and Otolaryngology, 116270Q (5 March 2021); https://doi.org/10.1117/12.2588696
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Short wave infrared radiation

Teeth

Cameras

Dental caries

Indium gallium arsenide

Infrared detectors

Infrared radiation

RELATED CONTENT


Back to Top