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20 November 1989 Accuracy Of Fringe Pattern Analysis
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Abstract
In this paper, affecting factors on accuracy of fitting wavefron of light beam with orthogonal polynomials are given theoretically in terms of F-test method of statistics. The method availability to control accuracy has also been verified experimentally by an axial hologram reconstruction.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gui-Ying Wang and Xiao-Ping Ling "Accuracy Of Fringe Pattern Analysis", Proc. SPIE 1163, Fringe Pattern Analysis, (20 November 1989); https://doi.org/10.1117/12.962800
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