CCD Based Moire Interferometric Strain Sensor (MISS)

A. Asundi; Kan Man Fung

doi:10.1117/12.962787

20 November 1989 CCD Based Moire Interferometric Strain Sensor (MISS)

A. Asundi, Kan Man Fung

Proceedings Volume 1163, Fringe Pattern Analysis; (1989) https://doi.org/10.1117/12.962787
Event: 33rd Annual Technical Symposium, 1989, San Diego, United States

Abstract

The Moire Interferometric Strain Sensor (MISS) is based on the principle that gratings diffract light in preferred directions determined by their frequency. Hence by tracking the change in diffraction angle the frequency of the grating can be determined. In engineering applications, a grating attached to the specimen would change frequency as a consequence of the strain at that point. Thus the change in diffraction angle can directly be related to strain. Since for most elastic strain measurements the change in diffraction angle is very small, this paper describes the use of a CCD array to improve the sensitivity.

Citation Download Citation

A. Asundi and Kan Man Fung "CCD Based Moire Interferometric Strain Sensor (MISS)", Proc. SPIE 1163, Fringe Pattern Analysis, (20 November 1989); https://doi.org/10.1117/12.962787

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