British Standard On Surface Flaws

Lionel R. Baker; Alan Chapman; Taj Wojtowicz

doi:10.1117/12.962821

20 December 1989 British Standard On Surface Flaws

Lionel R. Baker, Alan Chapman, Taj Wojtowicz

Proceedings Volume 1164, Surface Characterization and Testing II; (1989) https://doi.org/10.1117/12.962821
Event: 33rd Annual Technical Symposium, 1989, San Diego, United States

Abstract

The existing British standard, BS 4301:1982, relating to cosmetic defects, such as scratches and digs, has proved difficult to apply. Both industry and the Ministry of Defence have stressed the urgent need for a technique which can be readily employed by the majority of optical component manufacturers, is suitable for assessing appearance and functional flaws, and has traceability to national standards. This paper describes a new proposal, under consideration by a BSI committee, which recommends replacing standard scratch artefacts, made by etching a rectangular trough in a glass substrate, by the use of a standard line reference plate used to calibrate a flaw comparator instrument. The problems currently met by industry when using present visibility standards, such as BS 4301:1982 and MIL-0-13830A:1963, will be discussed in relation to the new proposal in which the signifance of a flaw is quantified in terms of a line-equivalent width (LEW) rating. The method of operation of a microscope image comparator, used for calibrating reference flaws in terms of their LEW value, will be described, and results recently obtained by inspecting transmitting and reflecting surfaces, which may be flat or curved, coated or uncoated, will be presented.

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Lionel R. Baker, Alan Chapman, and Taj Wojtowicz "British Standard On Surface Flaws", Proc. SPIE 1164, Surface Characterization and Testing II, (20 December 1989); https://doi.org/10.1117/12.962821

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KEYWORDS

Standards development

Visibility

Calibration

Inspection

Microscopes

Defense and security

Light scattering

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