20 December 1989 Measuring Surface Profiles With The Scanning Tunneling Microscope
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Abstract
In the past two years scanning tunneling microscopy (STM) has expanded rapidly in several areas, over the size range from looking at atoms to looking at integrated circuits. In this paper we will cover some of the recent uses of STM and show some of the three-dimensional surface images which have now become routine.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
V. Elings, V. Elings, J. Gurley, J. Gurley, "Measuring Surface Profiles With The Scanning Tunneling Microscope", Proc. SPIE 1164, Surface Characterization and Testing II, (20 December 1989); doi: 10.1117/12.962814; https://doi.org/10.1117/12.962814
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