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20 December 1989 Suppression Of Tool Marks To Enhance Detection Of Surface Defects
C. W. Carroll; N. W.H. Sufi; R. C. Chang
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Proceedings Volume 1164, Surface Characterization and Testing II; (1989) https://doi.org/10.1117/12.962825
Event: 33rd Annual Technical Symposium, 1989, San Diego, United States
Abstract
Where surface quality is crucial, metal manufacturers employ surface inspection systems that use image processing techniques to distinguish defects from normal background. These systems are well suited for surfaces in which the defects are characterized by sharp variations in intensity from the average background intensity. However, in the presence of tool marks, the ability of the surface inspection systems to distinguish defects from normal background is severely degraded. This paper presents techniques based on optical/image processing concepts to suppress the tool-marks and thereby enhance the detectability of surface defects.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
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C. W. Carroll, N. W.H. Sufi, and R. C. Chang "Suppression Of Tool Marks To Enhance Detection Of Surface Defects", Proc. SPIE 1164, Surface Characterization and Testing II, (20 December 1989); https://doi.org/10.1117/12.962825
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