PROCEEDINGS VOLUME 1165
33RD ANNUAL TECHNICAL SYMPOSIUM | 7-11 AUGUST 1989
Scatter from Optical Components
IN THIS VOLUME

1 Sessions, 41 Papers, 0 Presentations
All Papers  (41)
33RD ANNUAL TECHNICAL SYMPOSIUM
7-11 August 1989
San Diego, United States
All Papers
Proc. SPIE 1165, Scatter From Optical Components: An Overview, 0000 (2 January 1990); doi: 10.1117/12.962831
Proc. SPIE 1165, Incident Angle Invariance In Surface Scatter, 0000 (2 January 1990); doi: 10.1117/12.962832
Proc. SPIE 1165, Application And Verification Of Wavelength Scaling For Near Specular Scatter Predictions, 0000 (2 January 1990); doi: 10.1117/12.962833
Proc. SPIE 1165, Subsurface And Volume Scattering From Smooth Surfaces, 0000 (2 January 1990); doi: 10.1117/12.962834
Proc. SPIE 1165, Opposition Effect In The Scattering Of Light From A Random Rough Metal Surface, 0000 (2 January 1990); doi: 10.1117/12.962835
Proc. SPIE 1165, Surface Statistics Determined From IR Scatter, 0000 (2 January 1990); doi: 10.1117/12.962836
Proc. SPIE 1165, Relating Surface Scattering Characteristics To Emissivity Changes During The Galvanneal Process, 0000 (2 January 1990); doi: 10.1117/12.962837
Proc. SPIE 1165, Light Scattered By Random Rough Surfaces And Roughness Determination, 0000 (2 January 1990); doi: 10.1117/12.962838
Proc. SPIE 1165, Surface Scatter Phenomena: A Linear, Shift-Invariant Process, 0000 (2 January 1990); doi: 10.1117/12.962839
Proc. SPIE 1165, An Investigation Of Anomalous Scatter From Beryllium Mirrors, 0000 (2 January 1990); doi: 10.1117/12.962840
Proc. SPIE 1165, An ERIM Perspective On BRDF Measurement Technology, 0000 (2 January 1990); doi: 10.1117/12.962841
Proc. SPIE 1165, The Prediction Of BRDFs From Surface Profile Measurements, 0000 (2 January 1990); doi: 10.1117/12.962842
Proc. SPIE 1165, The Reconciliation Of Scatter Data Obtained With Solar Simulator And Lasers,, 0000 (2 January 1990); doi: 10.1117/12.962843
Proc. SPIE 1165, BRDF Error Analysis, 0000 (2 January 1990); doi: 10.1117/12.962845
Proc. SPIE 1165, 45°/0° Bidirectional Reflectance Distribution Function Standard Development, 0000 (2 January 1990); doi: 10.1117/12.962846
Proc. SPIE 1165, Power Spectrum Standard For Surface Roughness: Part I, 0000 (2 January 1990); doi: 10.1117/12.962847
Proc. SPIE 1165, Measurement Of Light-Baffle Attenuation By A Gating Technique, 0000 (2 January 1990); doi: 10.1117/12.962848
Proc. SPIE 1165, Linearity In BSDF Measurements, 0000 (2 January 1990); doi: 10.1117/12.962849
Proc. SPIE 1165, BRDF Of Silicon Carbide And Aluminum Foam Compared To Black Paint At 3.39 Microns, 0000 (2 January 1990); doi: 10.1117/12.962850
Proc. SPIE 1165, Characterization Of Optical Baffle Materials, 0000 (2 January 1990); doi: 10.1117/12.962851
Proc. SPIE 1165, Low Scatter Edge Blackening Compounds For Refractive Optical Elements, 0000 (2 January 1990); doi: 10.1117/12.962852
Proc. SPIE 1165, Bidirectional Transmittance Distribution Function Of Several Infrared Materials At 3.39 Microns, 0000 (2 January 1990); doi: 10.1117/12.962853
Proc. SPIE 1165, Thermal Cycling Effects On The BRDF Of Beryllium Mirrors, 0000 (2 January 1990); doi: 10.1117/12.962854
Proc. SPIE 1165, BTDF Of Znse With Multilayer Coatings At 3.39 Microns, 0000 (2 January 1990); doi: 10.1117/12.962855
Proc. SPIE 1165, Bidirectional Reflectance Distribution Function (BRDF) Measurements On Multilayer Dielectric Coatings As A Function Of Polarization State, 0000 (2 January 1990); doi: 10.1117/12.962856
Proc. SPIE 1165, Study Of Polarization Effects On Scatter From Si Wafers, 0000 (2 January 1990); doi: 10.1117/12.962857
Proc. SPIE 1165, Scattering From Contaminated Surfaces, 0000 (2 January 1990); doi: 10.1117/12.962858
Proc. SPIE 1165, The Use Of A Simplified Model For Particulate Scatter, 0000 (2 January 1990); doi: 10.1117/12.962859
Proc. SPIE 1165, Cleanliness Correlation By BRDF And PFO Instruments, 0000 (2 January 1990); doi: 10.1117/12.962860
Proc. SPIE 1165, Contamination Effects On Optical Surfaces, 0000 (2 January 1990); doi: 10.1117/12.962861
Proc. SPIE 1165, A Means Of Eliminating The Effects Of Particulate Contamination On Scatter Measurements Of Superfine Optical Surfaces, 0000 (2 January 1990); doi: 10.1117/12.962862
Proc. SPIE 1165, Vacuum BRDF Measurements Of Cryogenic Optical Surfaces, 0000 (2 January 1990); doi: 10.1117/12.962863
Proc. SPIE 1165, Cleanliness Requirements For The Air In A BRDF Facility, 0000 (2 January 1990); doi: 10.1117/12.962864
Proc. SPIE 1165, Monte Carlo Simulation Of Contaminant Transport To And Deposition On Complex Spacecraft Surfaces, 0000 (2 January 1990); doi: 10.1117/12.962865
Proc. SPIE 1165, Surface Particle Obscuration And BRDF Predictions, 0000 (2 January 1990); doi: 10.1117/12.962866
Proc. SPIE 1165, Satellite Material Contaminant Optical Properties, 0000 (2 January 1990); doi: 10.1117/12.962867
Proc. SPIE 1165, Dark Field Photographic Techniques For Documenting Optical Surface Contamination., 0000 (2 January 1990); doi: 10.1117/12.962868
Proc. SPIE 1165, Design Of A Laboratory Study Of Contaminant Film Darkening In Space, 0000 (2 January 1990); doi: 10.1117/12.962869
Proc. SPIE 1165, Use Of A Cryogenically Cooled QCM In Conjunction With A Programmable Data Acquisition System To Detect And Examine Accreted Mass On The Sensing Crystal Caused By Environmental Contamination, 0000 (2 January 1990); doi: 10.1117/12.962870
Proc. SPIE 1165, Contamination Monitoring Approaches For EUV Space Optics, 0000 (2 January 1990); doi: 10.1117/12.962871
Proc. SPIE 1165, Results Of A CO[sub]2[/sub] BRDF Round Robin, 0000 (2 January 1990); doi: 10.1117/12.962872
Back to Top