BTDF Of Znse With Multilayer Coatings At 3.39 Microns

Lawrence M. Scherr; Karen Sorensen; Edward C. Hagerott; Russell M. Ono

doi:10.1117/12.962855

2 January 1990 BTDF Of Znse With Multilayer Coatings At 3.39 Microns

Lawrence M. Scherr, Karen Sorensen, Edward C. Hagerott, Russell M. Ono

Proceedings Volume 1165, Scatter from Optical Components; (1990) https://doi.org/10.1117/12.962855
Event: 33rd Annual Technical Symposium, 1989, San Diego, United States

Abstract

BTDF at 3.39 microns was measured on ZnSe substrates and on substrates with 1/3, 2/3, and full multilayer coatings. The BTDF range for coated samples overlaps the range for the uncoated ZnSe substrate.

Citation Download Citation

Lawrence M. Scherr, Karen Sorensen, Edward C. Hagerott, and Russell M. Ono "BTDF Of Znse With Multilayer Coatings At 3.39 Microns", Proc. SPIE 1165, Scatter from Optical Components, (2 January 1990); https://doi.org/10.1117/12.962855

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