2 January 1990 Dark Field Photographic Techniques For Documenting Optical Surface Contamination.
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Abstract
Recent developments in the manufacture of flight hardware have created a demand for new techniques for contamination measurements on optical surfaces. The stringent cleanliness requirements imposed by working with these optics prohibit traditional contamination testing. The handling of optical hardware restricts contamination inspection by standard procedures. In order to view and document surface cleanliness, new photographic techniques have been pushed to their limits to record the image of light scattered from particulate contamination on optical surfaces.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kenneth M. Aline, James A. Dowdall, "Dark Field Photographic Techniques For Documenting Optical Surface Contamination.", Proc. SPIE 1165, Scatter from Optical Components, (2 January 1990); doi: 10.1117/12.962868; https://doi.org/10.1117/12.962868
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