The Use Of A Simplified Model For Particulate Scatter

Kie Nahm; Paul R. Spyak; William L. Wolfe

doi:10.1117/12.962859

2 January 1990 The Use Of A Simplified Model For Particulate Scatter

Kie Nahm, Paul R. Spyak, William L. Wolfe

Proceedings Volume 1165, Scatter from Optical Components; (1990) https://doi.org/10.1117/12.962859
Event: 33rd Annual Technical Symposium, 1989, San Diego, United States

Abstract

A simplified model of scatter from particulate-coated optical surfaces has been presented formerly. Results using it are compared with measured data and with a more rigorous model that uses integrated Mie and imaging techniques.

Citation Download Citation

Kie Nahm, Paul R. Spyak, and William L. Wolfe "The Use Of A Simplified Model For Particulate Scatter", Proc. SPIE 1165, Scatter from Optical Components, (2 January 1990); https://doi.org/10.1117/12.962859

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