2 January 1990 The Use Of A Simplified Model For Particulate Scatter
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Proceedings Volume 1165, Scatter from Optical Components; (1990); doi: 10.1117/12.962859
Event: 33rd Annual Technical Symposium, 1989, San Diego, United States
Abstract
A simplified model of scatter from particulate-coated optical surfaces has been presented formerly. Results using it are compared with measured data and with a more rigorous model that uses integrated Mie and imaging techniques.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kie Nahm, Paul R. Spyak, William L. Wolfe, "The Use Of A Simplified Model For Particulate Scatter", Proc. SPIE 1165, Scatter from Optical Components, (2 January 1990); doi: 10.1117/12.962859; https://doi.org/10.1117/12.962859
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KEYWORDS
Particles

Light scattering

Atmospheric modeling

Data modeling

Mie scattering

Control systems

Optical spheres

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