Polarimetry, or transmission ellipsometry, is an important experimental technique for the determination of polarization properties of bulk materials. In this technique, source radiation of known polarization is passed through bulk samples to determine, for example, natural or induced birefringence and dichroism. The laser is a particularly appropriate source for this technique because of its monochromaticity, collimation, and radiant intensity. Lasers of many different wavelengths in different spectral regions are now available. Laser polarimetry can be done in any of these wavelength regions where polarizing elements are available. In this paper, polari-metry is reviewed with respect to applications, sources used, and polarization state generator and analyzer configurations. Scattering ellipsometry is also discussed insofar as the forward scattering measurement is related to polarimetry. We then describe an infrared laser polarimeter which we have designed and constructed. This instrument can operate over large wavelength regions with only a change in source. Polarization elements of the polarimeter are in a dual rotating retarder configuration. Computer controlled rotary stages and computer moni-tored detectors automate the data collection. The Mueller formulation is used to process the polarization infor-mation. Issues and recent progress with this instrument are discussed.