Presentation + Paper
5 March 2021 AlGaN/GaN heterostructures for plasma wave detection and emission in THz regime
M. Sakowicz, P. Sai, D. B. But, G. Cywinski, M. Dub, I. Kašalynas, P. Prystawko, S. Rumyantsev, W. Knap
Author Affiliations +
Abstract
We report on the investigations of the fin-shaped GaN/AlGaN field effect transistors with two lateral Schottky barrier gates exactly placed on the edges of the fin-shaped transistor channel. This kind FinFET modification (EdgeFET) allowed us to efficiently control the current flow in two-dimensional electron gas conduction channel. We present experimental data of sub THz detection by EdgeFETs. We describe also how it is beneficial for observation of resonant plasma wave THz detection and emission.
Conference Presentation
© (2021) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. Sakowicz, P. Sai, D. B. But, G. Cywinski, M. Dub, I. Kašalynas, P. Prystawko, S. Rumyantsev, and W. Knap "AlGaN/GaN heterostructures for plasma wave detection and emission in THz regime", Proc. SPIE 11685, Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XIV, 116850C (5 March 2021); https://doi.org/10.1117/12.2576870
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KEYWORDS
Plasma

Field effect transistors

Terahertz radiation

Fin field effect transistors

Heterojunctions

Transistors

Gallium nitride

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